CMOS Test and Evaluation
A Physical Perspective
(Sprache: Englisch)
CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability,...
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CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers statistical data analysis and visualization techniques, test equipment and CMOS product specifications, and examines product behavior over its full voltage, temperature and frequency range.
Inhaltsverzeichnis zu „CMOS Test and Evaluation “
Introduction.- CMOS Circuit Basics.- CMOS Storage Elements and Synchronous Logic.- IDDQ and Power.- Embedded PVT Monitors.- Variability.- Product Chip Test and Characterization.- Reliability, Burn-In and Guardbands.- Data Analysis and Characterization.- CMOS Metrics and Model Evaluation.Autoren-Porträt von Manjul Bhushan, Mark B. Ketchen
Manjul Bhushan is a technical consultant in New York.Mark Ketchen is a technical consultant in Massachusetts.
Bibliographische Angaben
- Autoren: Manjul Bhushan , Mark B. Ketchen
- 2015, 2015, XIII, 424 Seiten, Maße: 16,1 x 24,2 cm, Gebunden, Englisch
- Verlag: Springer, Berlin
- ISBN-10: 1493913484
- ISBN-13: 9781493913480
Sprache:
Englisch
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