Design, Analysis and Test of Logic Circuits Under Uncertainty
(Sprache: Englisch)
Combining theory with practical examples, this volume presents a comprehensive overview of logic circuits. The text presents techniques used to analyze, design and test logic circuits with probabilistic behavior, and provides a multidisciplinary approach to uncertainty.
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Combining theory with practical examples, this volume presents a comprehensive overview of logic circuits. The text presents techniques used to analyze, design and test logic circuits with probabilistic behavior, and provides a multidisciplinary approach to uncertainty.
Klappentext zu „Design, Analysis and Test of Logic Circuits Under Uncertainty “
Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.
Inhaltsverzeichnis zu „Design, Analysis and Test of Logic Circuits Under Uncertainty “
Introduction.- Probabilistic Transfer Matrices.- Computing with Probabilistic Transfer Matrices.- Testing Logic Circuits for Probabilistic Faults.- Signtaure-based Reliability Analysis.- Design for Robustness.- Summary and Extensions.
Bibliographische Angaben
- Autoren: Smita Krishnaswamy , Igor L. Markov , John P. Hayes
- 2014, 2013., 124 Seiten, Maße: 23,5 cm, Kartoniert (TB), Englisch
- Verlag: Springer Netherlands
- ISBN-10: 9400797982
- ISBN-13: 9789400797987
Sprache:
Englisch
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