Electrical Overstress
The Nemesis of Semiconductor Components
(Sprache: Englisch)
This book will provide a broad but detailed view of Electrical Overstress in semiconductor devices, with a focus on integrated circuit and discrete devices. It will equip the reader with the understanding needed to address EOS damage seen in their work...
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This book will provide a broad but detailed view of Electrical Overstress in semiconductor devices, with a focus on integrated circuit and discrete devices. It will equip the reader with the understanding needed to address EOS damage seen in their work environment and help them identify and correct the sources of EOS damage.
Klappentext zu „Electrical Overstress “
This book will provide a broad but detailed view of Electrical Overstress in semiconductor devices, with a focus on integrated circuit and discrete devices. It will equip the reader with the understanding needed to address EOS damage seen in their work environment and help them identify and correct the sources of EOS damage.
Inhaltsverzeichnis zu „Electrical Overstress “
Origins of EOS.- EOS/Surge Standards.- Device Physics at EOS Stress Levels.- EOS Induced Damage.- EOS Protection Elements and Their Use.- Debugging EOS Failures.- Designing EOS Robust Circuits.- Evaluation Techniques for EOS Robustness.
Bibliographische Angaben
- Autor: James Vinson
- 2016, 1st ed. 2015., 300 Seiten, 80 Schwarz-Weiß-Abbildungen, Maße: 15,5 x 23,5 cm, Gebunden, Englisch
- Verlag: Springer
- ISBN-10: 1441987789
- ISBN-13: 9781441987785
- Erscheinungsdatum: 07.01.2016
Sprache:
Englisch
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