Electron Backscatter Diffraction in Materials Science
(Sprache: Englisch)
Providing the fundamental basis for electron backscatter diffraction in materials science, this book analyzes the current state of both hardware and software, and gives examples of applications of electron backscatter diffraction to a wide-range of materials.
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Providing the fundamental basis for electron backscatter diffraction in materials science, this book analyzes the current state of both hardware and software, and gives examples of applications of electron backscatter diffraction to a wide-range of materials.
Klappentext zu „Electron Backscatter Diffraction in Materials Science “
Electron backscatter diffraction is a very powerful and relatively new materials characterization technique aimed at the determination of crystallographic texture, grain boundary character distributions, lattice strain, phase identification, and much more. The purpose of this book is to provide the fundamental basis for electron backscatter diffraction in materials science, the current state of both hardware and software, and illustrative examples of the applications of electron backscatter diffraction to a wide-range of materials including undeformed and deformed metals and alloys, ceramics, and superconductors.The text has been substantially revised from the first edition, and the authors have kept the format as close as possible to the first edition text. The new developments covered in this book include a more comphrensive coverage of the fundamentals not covered in the first edition or other books in the field, the advances in hardware and software since the first edition was published, and current examples of application of electron backscatter diffraction to solve challenging problems in materials science and condensed-matter physics.
Inhaltsverzeichnis zu „Electron Backscatter Diffraction in Materials Science “
- List of Contributors1. The Development of Automated Diffraction in Scanning and Transmission Electron Microscopy; D.J. Dingley
2. Theoretical Framework for Electron Backscatter Diffraction; V. Randle
3. Representation of Texture in Orientation Space; K. Rajan
4. Rodriques-Frank Representations of Crystallographic Texture; K. Rajan
5. Fundamentals of Automated EBSD; S.I. Wright
6. Studies on the Accuracy of Electron Backscatter Diffraction Measurements; M.C. Demirel, B.S. El-Dasher, B.L. Adams, A.D. Rollett
7. Phase Identification Using Electron Backscatter Diffraction in the Scanning Electron Microscope; J.R. Michael
8. Three-Dimensional Orientation Imaging; D.J. Jensen
9. Automated Electron Backscatter Diffraction: Present State and Prospects; R.A. Schwarzer
10. EBSD: Buying a Systems; A. Eades
11. Hardware and Software Optimization for Orientation Mapping and Phase Identification; P.P. Camus
12. An Automated EBSD Acquisition and Processing System; P. Rolland, K.G. Dicks
13. Advanced Software Capabilities for Automated EBSD; S.I. Wright, D.P. Field, D.J. Dingley
14. Strategies for Analysis of EBSD Datasets; W.E. King, J.S. Stölken, M. Kumar, A.J. Schwartz
15. Structure-Property Relations: EBSD-Based Materials-Sensitive Design; B.L. Adams, B.L. Henrie, L.L. Howell, R.J. Balling
16. Use of EBSD Data in Mesoscale Numerical Analyses; R. Becker, H. Weiland
17. Characterization of Deformed Microstructures; D.P. Field, H. Weiland
18. AnisotropicPlasticity Modeling Incorporating EBSD Characterization of Tantalum and Zirconium; J.F. Bingert, G.C. Kaschner, T.A. Mason, P.J. Maudlin, G.T. Gray III
19. Measuring Strains Using Electron Backscatter Diffraction; A.J. Wilkinson
20. Mapping Residual Plastic Strain in Materials Using Electron Backscatter Diffraction; E.M. Lehockey, Yang-Pi Lin, O.E. Lepik
21.EBSD Contra TEM Characterization of a Deformed Aluminum Single Crystal; Xiaoxu Huang, D.J. Jensen
22.
... mehr
Continuous Recrystallization and Grain Boundaries in a Superplastic Aluminum Alloy; T.R. McNelley
23. Analysis of Facets and Other Surfaces Using Electron Backscatter Diffraction; V. Randle
24. EBSD of Ceramic Materials; J.K. Farrer, J.R. Michael, C.B. Carter
25. Grain Boundary Character Based Design of Polycrystalline High Temperature Superconducting Wires; A. Goyal
- Index
23. Analysis of Facets and Other Surfaces Using Electron Backscatter Diffraction; V. Randle
24. EBSD of Ceramic Materials; J.K. Farrer, J.R. Michael, C.B. Carter
25. Grain Boundary Character Based Design of Polycrystalline High Temperature Superconducting Wires; A. Goyal
- Index
... weniger
Autoren-Porträt
Adam J. Schwartz is the Deputy Division Leader for Condensed Matter and High Pressure Physics in the Physics and Advanced Technologies Directorate. Dr. Schwartz joined LLNL as a post-doctoral research associate to investigate the systematics of displacive phase transformations after receiving his PhD from the University of Pittsburgh in 1991. His areas of interests focus on structure-propoerty-processing relations, aging and phase transformations in actinides; influence of microstructure and impurities on high-strain rate deformation behavior, texture and texture gradients in materials, intercrystalline defects and the role of grain boundary character distribution in materials, conventional and high resolution transmission electron microscopy, and electron backscatter diffraction. Dr. Schwartz has authored over 50 publications and has one patent.
Bibliographische Angaben
- 2009, 2nd ed., XXII, 403 Seiten, Maße: 19,6 x 25,9 cm, Gebunden, Englisch
- Herausgegeben: Adam J. Schwartz, Mukul Kumar, Brent L. Adams, David P. Field
- Verlag: Springer, Berlin
- ISBN-10: 0387881352
- ISBN-13: 9780387881355
- Erscheinungsdatum: 01.07.2009
Sprache:
Englisch
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