MEMS and Nanotechnology, Volume 5
Proceedings of the 2015 Annual Conference on Experimental and Applied Mechanics
(Sprache: Englisch)
The 16thInternational Symposium on MEMS and Nanotechnology, Volume 5 of the Proceedings of the 2015SEM Annual Conference& Exposition on Experimental and Applied Mechanics, the fifth volume of nine from the Conference, brings together contributions to...
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Klappentext zu „MEMS and Nanotechnology, Volume 5 “
The 16thInternational Symposium on MEMS and Nanotechnology, Volume 5 of the Proceedings of the 2015SEM Annual Conference& Exposition on Experimental and Applied Mechanics, the fifth volume of nine from the Conference, brings together contributions to this important area of research and engineering. The collection presents early findings and case studies on a wide range of areas, including: Microscale and Microstructural Effects on Mechanical Behavior
Dynamic Micro/Nanomechanics
In-situ Techniques
Mechanics of Graphene
Indentation and Small Scale Testing
MEMS
Inhaltsverzeichnis zu „MEMS and Nanotechnology, Volume 5 “
- Oxide Driven Strength Degradation of (1 1 1) Silicon Surfaces- Keynote: In situ TEM Nanomechanical Testing
- Poisson's Ratio as a Damage Index Sensed By Dual-embedded Fiber Bragg Grating Sensor
- In Situ High-Rate Mechanical Testing in the Dynamic Transmission Electron Microscope
- In-situ TEM Observation of Twinning, Detwinning and Retwinning in Quartz
- Nano to Macro: Mechanical Evaluation of Macroscopically Long Individual Nanofibers
- Evaluating Pile-Up and Sink-In During Nanoindentation of Thin Films
- Tapered Cantilevered Bimorphs for Piezoelectric Energy Harvesting - Characterization With Impedance Spectroscopy
- Time and Temperature Dependence of Stress Relaxation in Al and Al Alloy Thin Films Application for MEMS
- Detecting Interconnect Damage in Shock Using Acoustic Emission Detection
- Application of Nanoindentation and Microdiffraction to Study Aging Effects in Lead Free Solder Interconnects
- High Rate Experimental Test Method for Harsh Environment Stretchable Electronics
- Measurement of the Electromechanical Response of Capacitors in Dynamic Loading Conditions
Bibliographische Angaben
- 2015, 1st ed. 2016, VII, 108 Seiten, 47 farbige Abbildungen, Maße: 21,5 x 28,5 cm, Gebunden, Englisch
- Herausgegeben: Barton C. Prorok, LaVern A. Starman
- Verlag: Springer, Berlin
- ISBN-10: 3319224573
- ISBN-13: 9783319224572
- Erscheinungsdatum: 12.11.2015
Sprache:
Englisch
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