Physical Limitations of Semiconductor Devices
(Sprache: Englisch)
Providing an important link between the theoretical knowledge in the field of non-linier physics and practical application problems in microelectronics, the purpose of the book is popularization of the physical approach for reliability assurance. Another...
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Providing an important link between the theoretical knowledge in the field of non-linier physics and practical application problems in microelectronics, the purpose of the book is popularization of the physical approach for reliability assurance. Another unique aspect of the book is the coverage given to the role of local structural defects, their mathematical description, and their impact on the reliability of the semiconductor devices.
Klappentext zu „Physical Limitations of Semiconductor Devices “
Providing an important link between the theoretical knowledge in the field of non-linier physics and practical application problems in microelectronics, the purpose of the book is popularization of the physical approach for reliability assurance. Another unique aspect of the book is the coverage given to the role of local structural defects, their mathematical description, and their impact on the reliability of the semiconductor devices.
Providing an important link between the theoretical knowledge in the field of non-linier physics and practical application problems in microelectronics, the purpose of the book is popularization of the physical approach for reliability assurance. Another unique aspect of the book is the coverage given to the role of local structural defects, their mathematical description, and their impact on the reliability of the semiconductor devices.
Inhaltsverzeichnis zu „Physical Limitations of Semiconductor Devices “
- Failures of Semiconductor Devices- Theoretical Basis of Current Instability in Transistor Structures
- Thermal Instability Mechanism
- Isothermal Current Instability in Silicon BJT and MOSFETs
- Isothermal Instability in Compound Semiconductor Devices
- Degradation Instabilities
- Conductivity Modulation in ESD Devices
- Physical Approach to Reliability
- Conclusion
Bibliographische Angaben
- Autoren: Vladislav A. Vashchenko , V. F. Sinkevitch
- 2010, 330 Seiten, Maße: 23,5 cm, Kartoniert (TB), Englisch
- Verlag: Springer
- ISBN-10: 1441945059
- ISBN-13: 9781441945051
Sprache:
Englisch
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