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Lifetime Spectroscopy / Springer Series in Materials Science Bd.85 (PDF)

A Method of Defect Characterization in Silicon for Photovoltaic Applications (Sprache: Englisch)
 
 
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Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. Since it is based on the recombination process, it provides insight into precisely those defects that are relevant to...

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Bestellnummer: 29645149

eBook (pdf) 309.23
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