Advances in Imaging and Electron Physics.Vol.173 Pt.2
Neutron and X-Ray Microscopy
(Sprache: Englisch)
This special volume of Advances in Imaging and Electron Physics details the current theory, experiments, and applications of neutron and x-ray optics and microscopy for an international readership across varying backgrounds and disciplines. Edited by Dr....
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Klappentext zu „Advances in Imaging and Electron Physics.Vol.173 Pt.2 “
This special volume of Advances in Imaging and Electron Physics details the current theory, experiments, and applications of neutron and x-ray optics and microscopy for an international readership across varying backgrounds and disciplines. Edited by Dr. Ted Cremer, these volumes attempt to provide rapid assimilation of the presented topics that include neutron and x-ray scatter, refraction, diffraction, and reflection and their potential application.- Contributions from leading authorities
- Informs and updates on all the latest developments in the field
Inhaltsverzeichnis zu „Advances in Imaging and Electron Physics.Vol.173 Pt.2 “
- Fast and Thermal Neutrons for Radiography and Isotope Detection
- Neutron Scatter Amplitude, Cross Section, Scatter Length, and Refractive Index
- Neutron Scatter Physics and Differential Cross Sections
- Kinematic Neutron Scatter in Crystals Without Lattice Vibrations
- Thermal-based Oscillations of Nuclei in a Crystal Lattice
- Kinematic Neutron Scatter in Crystals with Lattice Nuclei Vibration
- Dynamic Neutron Scatter
Jay Theodore Cremer
Jay Theodore Cremer
Jay Theodore Cremer
Jay Theodore Cremer
Jay Theodore Cremer
Jay Theodore Cremer
Jay Theodore Cremer
Bibliographische Angaben
- 2012, 540 Seiten, Maße: 15,2 x 22,9 cm, Gebunden, Englisch
- Herausgegeben: Jay Th. Cremer
- Verlag: Academic Press
- ISBN-10: 0123969697
- ISBN-13: 9780123969699
- Erscheinungsdatum: 30.11.2012
Sprache:
Englisch
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