Advances in X-Ray Analysis
(Sprache: Englisch)
The 39th Annual Denver X-Ray Conference on Applications of X-Ray Analysis was held July 30 -August 3, 1990, at the Sheraton Steamboat Resort and Conference Center, Steamboat Springs, Colorado. The "Denver Conference" is recognized to be a major event in the...
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Klappentext zu „Advances in X-Ray Analysis “
The 39th Annual Denver X-Ray Conference on Applications of X-Ray Analysis was held July 30 -August 3, 1990, at the Sheraton Steamboat Resort and Conference Center, Steamboat Springs, Colorado. The "Denver Conference" is recognized to be a major event in the x-ray analysis field, bringing together scientists and engineers from around the world to discuss the state of the art in x-ray applications as well as indications for future develop ments. In recent years there has been a steady expansion of applications of x-ray analysis to characterize surfaces and thin films. To introduce the audience to one of the exciting and important new developments in x-ray fluorescence, the topic for the Plenary Session of the 1990 Conference was: "Surface and Near-Surface X-Ray Spectroscopy. " The Conference had the privilege of inviting five leading world experts in the field of x-ray spectroscopy to deliver lectures at the Plenary Session. The first two lectures were on total-reflection x-ray fluorescence spectrometry. Professor P. Wobrauschek of Austria reviewed "Recent Developments and Results in Total-Reflection X-Ray Fluorescence. " Trends and applications of the technique were also discussed. Dr. T. Arai of Japan reported on "Surface and Near-Surface Analysis of Silicon Wafers by Total Reflection X-Ray Fluorescence. " He emphasized the importance of using proper x-ray optics to achieve high signal-to-noise ratios. A mathematical model relating the x-ray intensity to the depth of x-ray penetration was also described.
Inhaltsverzeichnis zu „Advances in X-Ray Analysis “
- Recent Developments and Results in Total Reflection X-Ray Fluorescence Analysis- Glancing Angle X-Ray Absorption Spectroscopy
- Semiconductor Surface Characterization by Synchrotron X-Ray Fluorescence Analysis
- Total-Reflection X-Ray Fluorescence of Thin Layers on and in Solids
- Trace Element Analysis of Solutions at the PPB Level
- Trace Analysis Using Eds: Applications to Thin-Film and Heterogeneous Samples
- Grazing Incidence X-Ray Fluorescence Analysis with Monochromatic Radiation
- Impurity Analysis on Si Wafer Using Monochro-Trex
- Chemical State Analysis by Soft X-Ray Emission Spectra with Molecular-Orbital Calculations
- Fundamentals of X-Ray Spectrometric Analysis Using Low-Energy Electron Excitation
- Chemical Bonding Studies of Solutions by High Resolution X-Ray Fluorescence Spectroscopy
- Advances in Boron Measurement with Wavelength Dispersive XRF
- Soft and Ultra-Soft X-Ray Spectrometry Using Long-Wavelength Dispersive Devices
- Requirement Analysis and Preliminary Design For Energy Dispersive X-Ray Fluorescence Analysis Software
- Quantitative XRF Analysis Using the Fundamental Algorithm
- Practical Application for the use of Statistics to Establish Quality Control and Implement Quality Assurance in X-Ray Fluorescence
- Drift in Energy Calibration of Energy Dispersive X-Ray Fluorescence Analyzers and Its Correction
- Current and Future Energy Dispersive Exafs Detector Systems
- High Throughput Rate Solid State Detector Systems for Fluorescence EXAFS
- A Review of the Relative Merits of Low Powered WDXRF EDXRF Spectrometers for Routine Quantitative Analysis
- Imaging XPS. A Contribution to 3D X-Ray Analysis
- Graphite Fusion of Geological Samples
- Fast, High-Resolution X-Ray Microfluorescence Imaging
- High-Temperature Displacement Measurement using A Scanning Focussed X-Ray Line Source
- On-Belt Determination of Calcium Concentration by X-Ray Fluorescence
- Niobium Concentration Measurement in Steel Samples with TXRF
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... mehr
Mass Absorption Coefficient Determination using Compton Scattered Tube Radiation: Applications, Limitations and Pitfalls
- Trace Element Analysis of Rocks by X-Ray Spectrometry
- X-Ray Fluorescence and Fire-Assay Collection: Useful Partners in the Determination of the Platinum-Group Elements
- X-Ray Fluorescence Analysis of High-Density Brines using a Compton Scattering Ratio Technique
- Secondary Target X-Ray Excitation in Vivo Measurement of Lead in Bone
- Phosphorus Determination in Borophosphosilicate or Phosphosilicate Glass Films on a Si Wafer by Wavelength Dispersive X-Ray Spectroscopy
- Non-Destructive Analysis of Venezuelan Artifacts of Different Sizes and Shapes for Provenance Studies
- X-Ray Fluorescence as a Problem-Solving Tool in the Paper Industry
- X-Ray Detectors: Pulse Height Shifts, Escape Peaks and Counting Losses
- Measurement of Mass Absorption Coefficients using Compton-Scattered Cu Radiation in X-Ray Diffraction Analysis
- Evaluation of the X-Ray Response of a Position-Sensitive Microstrip Detector with An Integrated Readout Chip
- Practical and "Unusual" Applications in X-Ray Diffraction using Position Sensitive Detectors
- CCD Based X-Ray Detectors
- Wide Angle and Small Angle X-Ray Scattering Applications using a Two-Dimensional Area Detector
- Evaluation of Reference X-Ray Diffraction Patterns in the Icdd Powder Diffraction File
- Matchdb-A Program for the Identification of Phases using a Digitized Diffraction-Pattern Database
- X-Ray Diffraction Analysis of Fly Ash. II. Results
- Development of a Calibration Method for Quantitative X-Ray Powder Diffraction of Size-Segregated Aerosols
- Strategies for Preferred Orientation Corrections in X-Ray Powder Diffraction using Line Intensity Ratios
- Quantification of Carbamazepine in Tablets by Powder X-Ray Diffractometry
- Mass Absorption Corrected X-Ray Diffraction Analysis of Entrained-Flow Reactor Coal Combustion Products
- A Focusing System for X-Ray Diffraction Studies of Materials Under High Pressure in the Diamond Cell
- Phase Analysis of Metallic Plutonium-Containing Fuel Alloys using Neutron Diffraction
- High-Temperature XRD Analysis of Polymers
- Residual Strains in Al2O3/Sic (Whisker) Composite From 25-1000°C
- Applications of X-Ray Diffraction Crystallite Size/Strain Analysis to Seismosaurus Dinosaur Bone
- The Substructure of Austenite and Martensite Through a Carburized Surface
- Determination of Lattice Parameter and Strain of ? Phases in Nickel-Base Superalloys by Synchrotron Radiation Parallel Beam Diffractometry
- The Effect of Satellite Lines From the X-Ray Source on X-Ray Diffraction Peaks
- X-Ray Topography and Tem Study of Crystal Defect Propagation in Epitaxially Grown Algaas Layers on Gaas(001)
- Lineshape Analysis of X-Ray Diffraction Profiles: Polyethylene and Model Copolymers
- Double-Crystal X-Ray Diffraction Studies of Si Ion-Implanted and Pulsed Laser-Annealed Gaas
- X-Ray Characterization of Thin Diamond Films Deposited by Hot-Filament Chemical Vapor Deposition
- Substructure-Magnetic Property Correlation in Fe/Ag Composite Thin Films
- The Thickness Measurements of Thin Bulk Film by X-Ray Method
- Oxygen Concentration Determination in Silicon Single Crystals by Precision Lattice Parameter Measurement
- Thermal Stress Relaxation in Vapor Deposited Thin Films
- An Expert System for the Validation and Interpretation of X-Ray Residual Stress Data
- Residual Stresses in Railroad Car Wheels
- Measurement of Residual Stresses by X-Ray Diffraction Near Simulated Heat Affected Zones in Austenitic Stainless Steels
- Use of X-Ray Diffraction using Gaussian Curve Method for Measuring Plastic Strain of Steels
- X-Ray Elastic Constants For ?-SiC and Residual Stress Anisotropy in a Hot-Pressed Al2O3/SiC (Whisker) Composite
- X-Ray Study on Fatigue Fracture Surfaces of Aluminum Alloy Reinforced with Silicon Carbide Whiskers
- Residual Stress Analysis of Silicon Nitride to Carbon Steel Joint
- Residual Stresses in Unidirectional Al2O3 Fiber/Silicate Glass Composites by X-Ray Diffraction
- X-Ray Residual Stress Measurement of Ground Surface of Metal-Ceramic Composite
- Determination of X-Ray Elastic Constants in a Ti-14Al-21Nb Alloy and a Ti-14Al-21Nb/Sic Metal Matrix Composite
- A Method for X-Ray Stress Analysis of Thin Films and Its Application to Zinc-Nickel-Alloy Electroplated Steel
- Fracture Analysis of Nodular Cast Iron by X-Ray Fractography
- X-Ray Fractographic Study on Alumina and Zirconia Ceramics
- Author Index
- Trace Element Analysis of Rocks by X-Ray Spectrometry
- X-Ray Fluorescence and Fire-Assay Collection: Useful Partners in the Determination of the Platinum-Group Elements
- X-Ray Fluorescence Analysis of High-Density Brines using a Compton Scattering Ratio Technique
- Secondary Target X-Ray Excitation in Vivo Measurement of Lead in Bone
- Phosphorus Determination in Borophosphosilicate or Phosphosilicate Glass Films on a Si Wafer by Wavelength Dispersive X-Ray Spectroscopy
- Non-Destructive Analysis of Venezuelan Artifacts of Different Sizes and Shapes for Provenance Studies
- X-Ray Fluorescence as a Problem-Solving Tool in the Paper Industry
- X-Ray Detectors: Pulse Height Shifts, Escape Peaks and Counting Losses
- Measurement of Mass Absorption Coefficients using Compton-Scattered Cu Radiation in X-Ray Diffraction Analysis
- Evaluation of the X-Ray Response of a Position-Sensitive Microstrip Detector with An Integrated Readout Chip
- Practical and "Unusual" Applications in X-Ray Diffraction using Position Sensitive Detectors
- CCD Based X-Ray Detectors
- Wide Angle and Small Angle X-Ray Scattering Applications using a Two-Dimensional Area Detector
- Evaluation of Reference X-Ray Diffraction Patterns in the Icdd Powder Diffraction File
- Matchdb-A Program for the Identification of Phases using a Digitized Diffraction-Pattern Database
- X-Ray Diffraction Analysis of Fly Ash. II. Results
- Development of a Calibration Method for Quantitative X-Ray Powder Diffraction of Size-Segregated Aerosols
- Strategies for Preferred Orientation Corrections in X-Ray Powder Diffraction using Line Intensity Ratios
- Quantification of Carbamazepine in Tablets by Powder X-Ray Diffractometry
- Mass Absorption Corrected X-Ray Diffraction Analysis of Entrained-Flow Reactor Coal Combustion Products
- A Focusing System for X-Ray Diffraction Studies of Materials Under High Pressure in the Diamond Cell
- Phase Analysis of Metallic Plutonium-Containing Fuel Alloys using Neutron Diffraction
- High-Temperature XRD Analysis of Polymers
- Residual Strains in Al2O3/Sic (Whisker) Composite From 25-1000°C
- Applications of X-Ray Diffraction Crystallite Size/Strain Analysis to Seismosaurus Dinosaur Bone
- The Substructure of Austenite and Martensite Through a Carburized Surface
- Determination of Lattice Parameter and Strain of ? Phases in Nickel-Base Superalloys by Synchrotron Radiation Parallel Beam Diffractometry
- The Effect of Satellite Lines From the X-Ray Source on X-Ray Diffraction Peaks
- X-Ray Topography and Tem Study of Crystal Defect Propagation in Epitaxially Grown Algaas Layers on Gaas(001)
- Lineshape Analysis of X-Ray Diffraction Profiles: Polyethylene and Model Copolymers
- Double-Crystal X-Ray Diffraction Studies of Si Ion-Implanted and Pulsed Laser-Annealed Gaas
- X-Ray Characterization of Thin Diamond Films Deposited by Hot-Filament Chemical Vapor Deposition
- Substructure-Magnetic Property Correlation in Fe/Ag Composite Thin Films
- The Thickness Measurements of Thin Bulk Film by X-Ray Method
- Oxygen Concentration Determination in Silicon Single Crystals by Precision Lattice Parameter Measurement
- Thermal Stress Relaxation in Vapor Deposited Thin Films
- An Expert System for the Validation and Interpretation of X-Ray Residual Stress Data
- Residual Stresses in Railroad Car Wheels
- Measurement of Residual Stresses by X-Ray Diffraction Near Simulated Heat Affected Zones in Austenitic Stainless Steels
- Use of X-Ray Diffraction using Gaussian Curve Method for Measuring Plastic Strain of Steels
- X-Ray Elastic Constants For ?-SiC and Residual Stress Anisotropy in a Hot-Pressed Al2O3/SiC (Whisker) Composite
- X-Ray Study on Fatigue Fracture Surfaces of Aluminum Alloy Reinforced with Silicon Carbide Whiskers
- Residual Stress Analysis of Silicon Nitride to Carbon Steel Joint
- Residual Stresses in Unidirectional Al2O3 Fiber/Silicate Glass Composites by X-Ray Diffraction
- X-Ray Residual Stress Measurement of Ground Surface of Metal-Ceramic Composite
- Determination of X-Ray Elastic Constants in a Ti-14Al-21Nb Alloy and a Ti-14Al-21Nb/Sic Metal Matrix Composite
- A Method for X-Ray Stress Analysis of Thin Films and Its Application to Zinc-Nickel-Alloy Electroplated Steel
- Fracture Analysis of Nodular Cast Iron by X-Ray Fractography
- X-Ray Fractographic Study on Alumina and Zirconia Ceramics
- Author Index
... weniger
Bibliographische Angaben
- 2013, 1991, XXI, 743 Seiten, 2 farbige Abbildungen, Maße: 17,8 x 25,4 cm, Kartoniert (TB), Englisch
- Herausgegeben: Charles S. Barrett, M. Amara, Ting C. Huang, Nick Bernard, Dietrich Knorr
- Verlag: Springer, Berlin
- ISBN-10: 1461366674
- ISBN-13: 9781461366676
Sprache:
Englisch
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