Applied Scanning Probe Methods III
Characterization
(Sprache: Englisch)
The Nobel Prize of 1986 on Sc- ning Tunneling Microscopy sig- led a new era in imaging. The sc- ning probes emerged as a new i- trument for imaging with a pre- sion suf?cient to delineate single atoms. At ?rst there were two - the Scanning Tunneling...
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The Nobel Prize of 1986 on Sc- ning Tunneling Microscopy sig- led a new era in imaging. The sc- ning probes emerged as a new i- trument for imaging with a pre- sion suf?cient to delineate single atoms. At ?rst there were two - the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the - gneticForceMicroscope,MFM,and the Electrostatic Force Microscope, EFM. The MFM will image a single magnetic bit with features as small as 10nm. With the EFM one can monitor the charge of a single electron. Prof. Paul Hansma at Santa Barbara opened the door even wider when he was able to image biological objects in aqueous environments. At this point the sluice gates were opened and a multitude of different instruments appeared. There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM. The probe microscopes do not require preparation of the sample and they operate in ambient atmosphere, whereas, the SEM must operate in a vacuum environment and the sample must be cross-sectioned to expose the proper surface. However, the SEM can record 3D image and movies, features that are not available with the scanning probes.
Inhaltsverzeichnis zu „Applied Scanning Probe Methods III “
- D Nikova, Tobias Lange, Hans Oberleithner, and Hermann Schillers: Atomic force microscopy in nanomedicine- Ille C. Gebeshuber, Manfred Drack, Fritz Aumayr, Herbert Störi, Hannspeter Winter, and Friedrich Franek: Scanning Probe Microscopy: From Living Cells to the Sub-Atomic Range
- Zachary Burton and Bharat Bhushan: Surface Characterization, Adhesion, and Friction Properties of Hydrophobic Leaf Surfaces and Nanopatterned Polymers for Surperhydrophobic Surfaces
- Scott Sills and Rene M. Overney: Probing Macromolecular Dynamics and the Influence of Finite Size Effects
- Laurent Nony, Enrico Gnecco, and Ernst Meyer: Investigation of Organic Supramolecules by Scanning Probe Microscopy in Ultra-High Vacuum
- Luca Gavioli and Massimo Sancrotti: Scanning Tunneling Spectroscopy on Organic and Inorganic Low-Dimensional Systems
- Oleg Tikhomirov, Massimiliano Labardi, Maria Allegrini: Scanning Probe Microscopy Applied to Ferroelectric Materials
- Renato Buzio, Corrado Boragno, Francesco Buatier, and Ugo Valbusa: Morphological and Tribological Characterization of Rough Surfaces by Atomic Force Microscopy
- Nikolai K. Myshkin, Mark I. Petrokovets, and Alexander V. Kovalev: AFM Applications for Contact and Wear Simulation
- AFM Applications for Analysis of Fullerene-like Nanoparticles: Lev Rapoport and Armen Verdyan
- James K. Knudsen: Scanning Probe Methods in the Magnetic Tape Industry.
Autoren-Porträt
Harald Fuchs, Jahrgang 1954 und Vater von drei Kindern, lebt in Pforzheim. Er arbeitete viele Jahre selbstständig in der Werbebranche, bis er sich 2004 umorientierte und unter anderem eine Ausbildung als Elektrobiologe absolvierte. 2008 begann er, sein Wissen auf eigenen Vorträgen und Seminaren an die Menschen weiterzugeben. Technologische sowie gesellschaftliche Entwicklungen und Veränderungen stehen dabei stets im Mittelpunkt seiner Betrachtungen.
Bibliographische Angaben
- 2006, 378 Seiten, mit farbigen Abbildungen, Maße: 16,7 x 24,2 cm, Gebunden, Englisch
- Herausgegeben:Bhushan, Bharat; Fuchs, Harald
- Herausgegeben: Bharat Bhushan, Harald Fuchs
- Verlag: Springer
- ISBN-10: 3540269096
- ISBN-13: 9783540269090
Sprache:
Englisch
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