Atomic Force Microscopy
(Sprache: Englisch)
Atomic force microscopes are very important tools for the advancement of science and technology. This book provides an introduction to the microscopes so that scientists and engineers can learn both how to use them, and what they can do.
Leider schon ausverkauft
versandkostenfrei
Buch (Gebunden)
78.25 €
39 DeutschlandCard Punkte
sammeln
- Lastschrift, Kreditkarte, Paypal, Rechnung
- Kostenlose Rücksendung
- Ratenzahlung möglich
Produktdetails
Produktinformationen zu „Atomic Force Microscopy “
Atomic force microscopes are very important tools for the advancement of science and technology. This book provides an introduction to the microscopes so that scientists and engineers can learn both how to use them, and what they can do.
Klappentext zu „Atomic Force Microscopy “
Atomic force microscopy is an amazing technique that allies a versatile methodology (that allows measurement of samples in liquid, vacuum or air) to imaging with unprecedented resolution. But it goes one step further than conventional microscopic techniques; it allows us to make measurements of magnetic, electrical or mechanical properties of the widest possible range of samples, with nanometre resolution. This book will demystify AFM for the reader, making it easy to understand, and to use. It is written by authors who together have more than 30 years experience in the design, construction and use of AFMs and will explain why the microscopes are made the way they are, how they should be used, what data they can produce, and what can be done with the data. Illustrative examples from the physical sciences, materials science, life sciences, nanotechnology and industry illustrate the different capabilities of the technique.
Inhaltsverzeichnis zu „Atomic Force Microscopy “
- 1: Introduction
- 2: Instrumental Aspects of AFM
- 3: AFM Modes
- 4: Measuring AFM Images
- 5: Image Processing in AFM
- 6: Image Artifacts in AFM
- 7: Applications of AFM
- Appendix 1: AFM Standards and Calibration Specimens
- Appendix 2: AFM Software
Autoren-Porträt von Peter Eaton, Paul West
Peter Eaton has more than ten years' experience in research using Atomic Force Microscopy. He has used a wide variety of AFM instruments in research centres and universities in the UK, France, Spain, and Portugal. He has used AFM to study pharmaceutical, chemical, materials science, nanotech and biological samples. He is the author of more than twenty research publications on AFM.Paul West has over twenty-five years' experience with the development of atomic force microscopes. He is the co-founder of several AFM companies, the author of numerous patents, and co-author of several publications on the design and application of atomic force microscopes. He served on the United States National Nanotechnology Initiative which resulted in the first major funding of nanotechnology research.
Bibliographische Angaben
- Autoren: Peter Eaton , Paul West
- 2010, 256 Seiten, 9 farbige Abbildungen, 150 Schwarz-Weiß-Abbildungen, Maße: 25,6 cm, Gebunden, Englisch
- Verlag: Oxford University Press
- ISBN-10: 0199570450
- ISBN-13: 9780199570454
- Erscheinungsdatum: 31.03.2010
Sprache:
Englisch
Pressezitat
Atomic Force Microscopy is a great introduction to AFMs for beginners and, although light on theory, also serves as a good starting point for more serious users. Udo D. Schwarz, Physics Today
Kommentar zu "Atomic Force Microscopy"
0 Gebrauchte Artikel zu „Atomic Force Microscopy“
| Zustand | Preis | Porto | Zahlung | Verkäufer | Rating |
|---|
Schreiben Sie einen Kommentar zu "Atomic Force Microscopy".
Kommentar verfassen