Controlled Atmosphere Transmission Electron Microscopy
Principles and Practice
(Sprache: Englisch)
This book illustrates the practical workings of environmental transmission electron microscopy (ETEM) from history and instrument design through to solving practical problems. Aspects of instrument design, performance, and operating procedures are covered,...
Jetzt vorbestellen
versandkostenfrei
Buch (Gebunden)
106.99 €
53 DeutschlandCard Punkte
sammeln
- Lastschrift, Kreditkarte, Paypal, Rechnung
- Kostenlose Rücksendung
- Ratenzahlung möglich
Produktdetails
Produktinformationen zu „Controlled Atmosphere Transmission Electron Microscopy “
Klappentext zu „Controlled Atmosphere Transmission Electron Microscopy “
This book illustrates the practical workings of environmental transmission electron microscopy (ETEM) from history and instrument design through to solving practical problems. Aspects of instrument design, performance, and operating procedures are covered, together with common problems and pitfalls of the technique. Not only will a properly operated instrument and a carefully set up experiment provide new insight into your specimen, but the ability to observe the specimen in its natural habitat will be essential to meeting specific design criteria for the development of the next generation of materials. Over the past five decades, transmission electron microscopy (TEM) under environmental conditions relevant to a particular sample has been of increasing interest. Symposia dealing with the topic are now among the best attended at international microscopy conferences. Since typical operating modes for the ETEM require the sample be subjected to a harsh environment consisting of corrosive gases and high temperatures, the challenges of adapting and operating the instrument for observation under dynamic operating conditions are numerous. However, careful consideration of the interaction of the electrons with the gases and sample, as well as the gases with the microscope components, can lead to highly rewarding results. In Controlled Atmosphere Transmission Electron Microscopy, leading experts help you to perform successful experiments using the ETEM, and to interpret and understand the results.
Inhaltsverzeichnis zu „Controlled Atmosphere Transmission Electron Microscopy “
The history of controlled atmosphere TEM.- The instrument.- Electron scattering on matter - imaging in gas.- Spectroscopy.- Instrument performance.- Gas handling.- Heating systems.- Electron-gas-sample effects/control experiments.- ESTEM.- Growth experiments.- Closed cell systems.- Liquid experiments.- Related techniques.
Autoren-Porträt
Thomas Hansen was born in Helsingør, Denmark andreceived his masters from the University of Copenhagen. He worked as a research scientist at Haldor Topsøe A/S, where he continued his PhD studies in collaboration with the University of New Mexico and the Technical University of Denmark. After serving as a post-doctoral fellow at the Fritz Haber Institute in Berlin, Dr. Hansen returned to Denmark as a researcher at the Center for Electron Nanoscopy at the Technical University and continues there as a senior researcher. He is responsible for the department's aberration corrected environmental transmission electron microscope and teaches a course on the use of electron microscopy for materials research along with guest lecturing in several other courses and international workshops. Dr. Hansen has published more than 70 peer-reviewed papers on characterization using electron microscopy and has organized several symposia at international conferences with in situ microscopy as themain theme.
Jakob B. Wagner was born in Odense, Denmark in 1974. He received his Master of Science in Physics degree at the University of Southern Denmark, Odense in 1999. In 2002, after completing his PhD studies at University of Copenhagen in collaboration with Haldor Topsøe A/S, Dr. Wagner served as a post doctoral fellow first at the Fritz Haber Institute in Berlin, Germany, then at Lund University, Sweden. In 2007, Dr. Wagner became a senior researcher at the newly started Center for Electron Nanoscopy at the Technical University of Denmark, where he became Scientific Director and Professor in 2013. He is responsible for the overall scientific use of the electron microscopy facility along with teaching and lecturing at various courses and workshops in advanced electron microscopy.
Dr. Wagner has published over 90 papers where electron microscopy has been a major tool for characterization and has organized several symposia at international conferences with insitu microscopy as the main theme
... mehr
Thomas Hansen was born in Helsingør, Denmark andreceived his masters from the University of Copenhagen. He worked as a research scientist at Haldor Topsøe A/S, where he continued his PhD studies in collaboration with the University of New Mexico and the Technical University of Denmark. After serving as a post-doctoral fellow at the Fritz Haber Institute in Berlin, Dr. Hansen returned to Denmark as a researcher at the Center for Electron Nanoscopy at the Technical University and continues there as a senior researcher. He is responsible for the department's aberration corrected environmental transmission electron microscope and teaches a course on the use of electron microscopy for materials research along with guest lecturing in several other courses and international workshops.
Dr. Hansen has published more than 70 peer-reviewed papers on characterization using electron microscopy and has organized several symposia at international conferences with in situ microscopy as themain theme.
Jakob B. Wagner was born in Odense, Denmark in 1974. He received his Master of Science in Physics degree at the University of Southern Denmark, Odense in 1999. In 2002, after completing his PhD studies at University of Copenhagen in collaboration with Haldor Topsøe A/S, Dr. Wagner served as a post doctoral fellow first at the Fritz Haber Institute in Berlin, Germany, then at Lund University, Sweden. In 2007, Dr. Wagner became a senior researcher at the newly started Center for Electron Nanoscopy at the Technical University of Denmark, where he became Scientific Director and Professor in 2013. He is responsible for the overall scientific use of the electron microscopy facility along with teaching and lecturing at various courses and workshops in advanced electron microscopy.
Dr. Wagner has published over 90 papers where electron microscopy has been a major tool for characterization and has organized several symposia at international conferences with insitu microscopy as the main theme
Dr. Hansen has published more than 70 peer-reviewed papers on characterization using electron microscopy and has organized several symposia at international conferences with in situ microscopy as themain theme.
Jakob B. Wagner was born in Odense, Denmark in 1974. He received his Master of Science in Physics degree at the University of Southern Denmark, Odense in 1999. In 2002, after completing his PhD studies at University of Copenhagen in collaboration with Haldor Topsøe A/S, Dr. Wagner served as a post doctoral fellow first at the Fritz Haber Institute in Berlin, Germany, then at Lund University, Sweden. In 2007, Dr. Wagner became a senior researcher at the newly started Center for Electron Nanoscopy at the Technical University of Denmark, where he became Scientific Director and Professor in 2013. He is responsible for the overall scientific use of the electron microscopy facility along with teaching and lecturing at various courses and workshops in advanced electron microscopy.
Dr. Wagner has published over 90 papers where electron microscopy has been a major tool for characterization and has organized several symposia at international conferences with insitu microscopy as the main theme
... weniger
Bibliographische Angaben
- 2015, 1st ed. 2016, VIII, 329 Seiten, 110 farbige Abbildungen, Maße: 16 x 24,1 cm, Gebunden, Englisch
- Herausgegeben: Thomas Willum Hansen, Jakob Birkedal Wagner
- Verlag: Springer, Berlin
- ISBN-10: 3319229877
- ISBN-13: 9783319229874
- Erscheinungsdatum: 26.10.2015
Sprache:
Englisch
Kommentar zu "Controlled Atmosphere Transmission Electron Microscopy"
0 Gebrauchte Artikel zu „Controlled Atmosphere Transmission Electron Microscopy“
| Zustand | Preis | Porto | Zahlung | Verkäufer | Rating |
|---|
Schreiben Sie einen Kommentar zu "Controlled Atmosphere Transmission Electron Microscopy".
Kommentar verfassen