Denoising in digital speckle pattern interferometry by Riesz wavelets
(Sprache: Englisch)
Over the years, optical measurement techniques have been the problem-solving backbone of many engineering applications such as nondestructive testing of materials, measurement of various material properties, structural analysis, and experimental mechanics....
Leider schon ausverkauft
versandkostenfrei
Buch
39.90 €
19 DeutschlandCard Punkte
sammeln
- Lastschrift, Kreditkarte, Paypal, Rechnung
- Kostenlose Rücksendung
Produktdetails
Produktinformationen zu „Denoising in digital speckle pattern interferometry by Riesz wavelets “
Klappentext zu „Denoising in digital speckle pattern interferometry by Riesz wavelets “
Over the years, optical measurement techniques have been the problem-solving backbone of many engineering applications such as nondestructive testing of materials, measurement of various material properties, structural analysis, and experimental mechanics. Digital speckle pattern interferometry gives these measurements with high accuracy. The main challenges in speckle interferometry manifest on phase mapping estimation, leading to the direct determination of the measurement. Furthermore, fringes correlation are characterized by a strong speckle noise defined as a granular structure resulting from self-interference of coherent waves randomly scattered from a rough surface, making it capable of giving the measurement of physical magnitude with an accuracy of the order of wavelength used. For this reason, several papers are published annually in the speckle noise reduction domain.
Autoren-Porträt von Abdelkrim Nassim, Yassine Tounsi, Ahmed Siari
Nassim, AbdelkrimAbdelkrim Nassim, Ph.D. in physics from Chouaib Doukkali University, Morocco in collaboration with FIAM Laboratory, Catholic University of Louvain, Belgium. He has published several papers about digital speckle pattern interferometry in the two principal domains: speckle de-noising and speckle fringes correlation analysis.
Bibliographische Angaben
- Autoren: Abdelkrim Nassim , Yassine Tounsi , Ahmed Siari
- 2018, 56 Seiten, Maße: 22 cm, Kartoniert (TB), Englisch
- Verlag: LAP Lambert Academic Publishing
- ISBN-10: 6139873827
- ISBN-13: 9786139873821
Sprache:
Englisch
Kommentar zu "Denoising in digital speckle pattern interferometry by Riesz wavelets"
0 Gebrauchte Artikel zu „Denoising in digital speckle pattern interferometry by Riesz wavelets“
| Zustand | Preis | Porto | Zahlung | Verkäufer | Rating |
|---|
Schreiben Sie einen Kommentar zu "Denoising in digital speckle pattern interferometry by Riesz wavelets".
Kommentar verfassen