Frontiers of Characterization and Metrology for Nanoelectronics
2007 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics
(Sprache: Englisch)
This book contains peer-reviewed papers presented at the 2007 International Conference on Frontiers of Characterization and Metrology. It emphasizes the frontiers of innovation in the characterization and metrology needed to advance nanoelectronics. It...
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This book contains peer-reviewed papers presented at the 2007 International Conference on Frontiers of Characterization and Metrology. It emphasizes the frontiers of innovation in the characterization and metrology needed to advance nanoelectronics. It provides an effective portrayal of the industry's characterization and metrology needs and how they are being addressed. It also offers a foundation for further advances in metrology and new ideas for research and development.
Bibliographische Angaben
- 2007, 1., 2007., XIV, 578 Seiten, Maße: 22,2 x 28 cm, Gebunden, Englisch
- Herausgegeben:Herr, Dan; Khosla, Rajinder P.; Secula, Erik M.; Seiler, David G.; Garner, C. Michael; McDonald, Robert; Diebold, Alain C.
- Herausgegeben: David G. Seiler, Alain C. Diebold, Robert McDonald, C. Michael Garner, Dan Herr, Rajinder P. Khosla, Erik M. Secula
- Verlag: Springer
- ISBN-10: 0735404410
- ISBN-13: 9780735404410
- Erscheinungsdatum: 17.10.2007
Sprache:
Englisch
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