Fundamentals of Forensic Science

Section I. Criminal Justice and Forensic Science CH1 Introduction CH2 Crime Scene Investigation CH3 The Nature of Evidence

Section II. Analytical Tools CH4 Microscopy CH5 Light and Matter CH6 Separation Methods

Section III. Biological Sciences CH7 Pathology CH8 Anthropology and Odontology CH9 Entomology CH10 Serology and Bloodstain Pattern Analysis CH11 DNA Analysis CH12 Forensic Hair Examinations

Section IV. Chemical Sciences CH13 Illicit Drugs CH14 Forensic Toxicology CH15 Textile Fibers CH16 Paint Analysis CH17 Soil and Glass CH18 Fires and Explosions

Section V. Physical Sciences CH19 Friction Ridge Examination CH20 Questioned Documents CH21 Firearms and Toolmarks CH22 Impression Evidence CH23 Forensic Engineering

Section VI. Legal and Forensic Science CH24 Digital Evidence and Computer Forensics CH25 Legal Aspects of Forensic Science

Dr. Max M. Houck is an internationally-recognized forensic expert with research interests in forensic science, education, and the forensic enterprise and its industries. He has worked in all aspects of forensic science, including at the FBI Laboratory. Dr. Houck has published widely in books and peer-reviewed journals. His anthropology and trace evidence casework includes the Branch Davidian Investigation, the September 11 attacks on the Pentagon, the D.B. Cooper case, the US Embassy bombings in Africa, and the West Memphis Three case, among hundreds of others. He served for six years as the Chair of the Forensic Science Educational Program Accreditation Commission (FEPAC). Dr. Houck is a Fellow of the Royal Society of Chemistry and a founding Co-Editor of the journal Forensic Science Policy and Management. Jay Siegel, PhD is retired Director of the Forensic and Investigative Sciences Program and Chair of the Department of Chemistry and Chemical Biology at Indiana University Purdue University Indianapolis. He was Director of the Forensic Science Program at Michigan State University for 25 years from 1980-2004 until his retirement as Professor Emeritus. Dr. Siegel is a Distinguished Member of the American Academy of Forensic Sciences and was named as Distinguished Alumni Scholar by his alma mater, George Washington University in 2011. He is co-editor of Forensic Science Policy and Management: An International Journal. He was a member of the National Academy of Sciences Forensic Science Committee from 2006-09.