Handbook of Microscopy for Nanotechnology
(Sprache: Englisch)
Nanostructured materials take on an enormously rich variety of properties and promise exciting new advances in micromechanical, electronic, and magnetic devices as well as in molecular fabrications. The structure-composition-processing-property...
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Nanostructured materials take on an enormously rich variety of properties and promise exciting new advances in micromechanical, electronic, and magnetic devices as well as in molecular fabrications. The structure-composition-processing-property relationships for these sub 100 nm-sized materials can only be understood by employing an array of modern microscopy and microanalysis tools. This complete reference provides a thorough treatment of these techniques and their applications in this fast-growing field.
Klappentext zu „Handbook of Microscopy for Nanotechnology “
Nanostructured materials take on an enormously rich variety of properties and promise exciting new advances in micromechanical, electronic, and magnetic devices as well as in molecular fabrications. The structure-composition-processing-property relationships for these sub 100 nm-sized materials can only be understood by employing an array of modern microscopy and microanalysis tools. Handbook of Microscopy for Nanotechnology aims to provide an overview of the basics and applications of various microscopy techniques for nanotechnology. This handbook highlights various key microcopic techniques and their applications in this fast-growing field. Topics to be covered include the following: scanning near field optical microscopy, confocal optical microscopy, atomic force microscopy, magnetic force microscopy, scanning turning microscopy, high-resolution scanning electron microscopy, orientational imaging microscopy, high-resolution transmission electron microscopy, scanning transmission electron microscopy, environmental transmission electron microscopy, quantitative electron diffraction, Lorentz microscopy, electron holography, 3-D transmission electron microscopy, high-spatial resolution quantitative microanalysis, electron-energy-loss spectroscopy and spectral imaging, focused ion beam, secondary ion microscopy, and field ion microscopy.
Nanostructured materials take on an enormously rich variety of properties and promise exciting new advances in micromechanical, electronic, and magnetic devices as well as in molecular fabrications. The structure-composition-processing-property relationships for these sub 100 nm-sized materials can only be understood by employing an array of modern microscopy and microanalysis tools. Handbook of Microscopy for Nanotechnology aims to provide an overview of the basics and applications of various microscopy techniques for nanotechnology. This handbook highlights various key microcopic techniques and their applications in this fast-growing field. Topics to be covered include the following: scanning near field optical microscopy, confocal optical microscopy, atomic force microscopy, magnetic force microscopy, scanning turning microscopy, high-resolution scanning electron microscopy, orientational imaging microscopy, high-resolution transmission electron microscopy, scanning transmission electron microscopy, environmental transmission electron microscopy, quantitative electron diffraction, Lorentz microscopy, electron holography, 3-D transmission electron microscopy, high-spatial resolution quantitative microanalysis, electron-energy-loss spectroscopy and spectral imaging, focused ion beam, secondary ion microscopy, and field ion microscopy.
Inhaltsverzeichnis zu „Handbook of Microscopy for Nanotechnology “
- Optical Microscopy, ScanningProbe Microscopy, Ion Microscopy, and Nanofabrication... Confocal Scanning Optical Microscopy and Nanotechnology
... Scanning Near Field Optical Microscopy in Nanosciences
... Scanning Tunneling Microscopy
... Visualization of Nanostructures with Atomic Force Microscopy
... Scanning Probe Microscopy for Nanoscale Manipulation and PAtterning
... Scannning Thermal and Thermoelectric Microscopy
... Imaging Secondary Ion Mass Spectrometry
... Atom Probe Tomography
... Focused Ion Beam Systems - A Multifunctional Tool for Nanotechnology
... Electronc Beam Lithography
- Electron Microscopy
... High Resolution Scanning Electron Microscopy
... High-spatial Resolution Quantitative Electron Beam Microanalysis for Nanoscale Materials
... Characterization of Nano-Crystalline Materials using Electronc Backscatter Diffraction in the Scanning Electron Microscope
... High-Resolution Transmission Electron Microscopy
... Scanning Transmission Electron Microscopy
... In-Situ Electron Microscopy for Nanomeasurements
... Environmental Transmission Electron Microscopy in Nanotechnology
... Electron Nanocrystallography
... Tomography using Transmission Electron Microscope
... Off-Axid Electron Holography
... Sub-nm Spatially Resolved EELS (Electron Energy-Loss Spectroscopy): Methods, Theory and Applications
... Imaging Magnetic Structures using Transmission Electron Microscopy Methods
- Index
Bibliographische Angaben
- 2005, 2005, 768 Seiten, Maße: 16 x 24,1 cm, Gebunden, Englisch
- Herausgegeben: Zhong Lin Wang, Nan Yao
- Verlag: Springer Netherlands
- ISBN-10: 1402080034
- ISBN-13: 9781402080036
- Erscheinungsdatum: 21.03.2005
Sprache:
Englisch
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