Handbook of Monochromatic XPS Spectra.Vol.1
The Elements and Native Oxides
(Sprache: Englisch)
:
These three volumes provide comprehensive information about the instrument, the samples, and the methods used to collect the spectra. The spectra are presented on a landscape format and cover a wide variety of elements,polymers, semiconductors, and other...
These three volumes provide comprehensive information about the instrument, the samples, and the methods used to collect the spectra. The spectra are presented on a landscape format and cover a wide variety of elements,polymers, semiconductors, and other...
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Klappentext zu „Handbook of Monochromatic XPS Spectra.Vol.1 “
:These three volumes provide comprehensive information about the instrument, the samples, and the methods used to collect the spectra. The spectra are presented on a landscape format and cover a wide variety of elements,polymers, semiconductors, and other materials.
* Offers a clear presentation of spectra with the rightamount of experimental detail.
* All of the experiments have been conducted under controlled conditions on the same instrument by aworld-renowned expert.
Inhaltsverzeichnis zu „Handbook of Monochromatic XPS Spectra.Vol.1 “
ORGANIZATION AND DETAILS OF SPECTRAL SETSAlphabetical Organization of Spectra
Contents of Each Set of Spectra
Philosophy of Data Collection Methods
Peak-Fitting (Curve-Fitting) of High Energy Resolution Spectra
Charge Compensation of Insulating Materials
Abbreviations Used
INSTRUMENT AND ANALYSIS DETAILS USED TO MAKE XPS DATA
Instrument Details
Experimental Details
Data Processing Details
Sample Details
Energy Resolution Details
Energy Scale Reference Energies and Calibration Details
Electron Counting and Instrument Response Function Details
Effects of Poorly Focusing the Distance between the Sample and the Electron Lens
Quantitation Details and Choice of 'Sensitivity Exponents'
Crude Tests of the Reliability of Relative Sensitivity Factors
Traceability Details
Reference Papers Describing the Capabilities of X-Probe, M-Probe, and S-Probe XPS Systems
Bibliographische Angaben
- Autor: B. Vincent Crist
- 2000, 1. Auflage, XXVIII, 520 Seiten, Maße: 21,6 x 26,5 cm, Gebunden, Englisch
- Verlag: Wiley & Sons
- ISBN-10: 0471492655
- ISBN-13: 9780471492658
Sprache:
Englisch
Pressezitat
"...a very good practical reference source." ( IEEE Electrical Insulation Magazine , Vol. 19, No. 4, July-August 2003)
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