Introduction To Mixed-Signal IC Test and Measurement
(Sprache: Englisch)
Integrated circuits incorporating both digital and analog functions have become increasingly prevalent in the semiconductor industry. Mixed-signal IC test and measurement has grown into a highly specialized field of electrical engineering. However, test...
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Integrated circuits incorporating both digital and analog functions have become increasingly prevalent in the semiconductor industry. Mixed-signal IC test and measurement has grown into a highly specialized field of electrical engineering. However, test engineering is still a relatively
unknown profession compared to IC design engineering. It has become harder to hire and train new engineers to become skilled mixed-signal test engineers. The slow learning curve for mixed-signal test engineers is largely due to the shortage of written materials and university-level courses on the
subject of mixed-signal testing. While many textbooks have been devoted to the subject of digital test and testability, the same cannot be said for analog and mixed-signal automated test and measurement.
An Introduction to Mixed-Signal IC Test and Measurement is a textbook for advanced undergraduate and graduate-level students as well as engineering professionals. It was written in response to the shortage of basic course material for mixed-signal test and measurement. The book assumes a solid
background in analog and digital circuits as well as a working knowledge of computers and computer programming. A background in digital signal processing and statistical analysis is also helpful, though not absolutely necessary.
This text encompasses the testing of both analog and mixed-signal circuits including many borderline examples. Digital testing is covered, but not as extensively because of the wealth of information on this topic already available. Examples and illustrations using state-of-the-art industrial
technology enrich and enliven the presentation throughout. In considering the applicationsof this technology, the testing of large-scale mixed-signal circuits and individual circuits is introduced. The value-added benefits of mixed-signal IC testing to a manufacturer's product are clearly
discussed, and the role of the test engineer is clearly defined.
unknown profession compared to IC design engineering. It has become harder to hire and train new engineers to become skilled mixed-signal test engineers. The slow learning curve for mixed-signal test engineers is largely due to the shortage of written materials and university-level courses on the
subject of mixed-signal testing. While many textbooks have been devoted to the subject of digital test and testability, the same cannot be said for analog and mixed-signal automated test and measurement.
An Introduction to Mixed-Signal IC Test and Measurement is a textbook for advanced undergraduate and graduate-level students as well as engineering professionals. It was written in response to the shortage of basic course material for mixed-signal test and measurement. The book assumes a solid
background in analog and digital circuits as well as a working knowledge of computers and computer programming. A background in digital signal processing and statistical analysis is also helpful, though not absolutely necessary.
This text encompasses the testing of both analog and mixed-signal circuits including many borderline examples. Digital testing is covered, but not as extensively because of the wealth of information on this topic already available. Examples and illustrations using state-of-the-art industrial
technology enrich and enliven the presentation throughout. In considering the applicationsof this technology, the testing of large-scale mixed-signal circuits and individual circuits is introduced. The value-added benefits of mixed-signal IC testing to a manufacturer's product are clearly
discussed, and the role of the test engineer is clearly defined.
Inhaltsverzeichnis zu „Introduction To Mixed-Signal IC Test and Measurement “
CHAPTER 1: OVERVIEW OF MIXED-SIGNAL TESTING; 1.1 Mixed-Signal Ciruits; 1.2 Why Test Mixed-Signal Devices; 1.3 Post-Silicon Production Flow; 1.4 Test and Diagnostic Equipment; 1.5 New Product Development; 1.6 Mixed-Signal Testing Challenges; CHAPTER 2: THE TEST SPECIFICATION PROCESS; 2.1 Device Data Sheets; 2.2 Generating the Test Plan; 2.3 Components of a Test Program; 2.4 Summary; CHAPTER 3: DC AND PARAMETRIC MEASUREMENTS; 3.1 Continuity; 3.2 Leakage Currents; 3.3 Power Supply Currents; 3.4 DC References and Regulators; 3.5 Impedance Measurements; 3.6 DC Offset Measurements; 3.7 DC Gain Measurements; 3.8 DC Power Supply Rejection Ratio; 3.9 DC Common Mode Rejection Ratio; 3.10 Comparator DC Tests; 3.11 Voltage Search Techniques; 3.12 DC Tests for Digital Circuits; 3.13 Summary; CHAPTER 4: MEASUREMENT ACCURACY; 4.1 Terminology; 4.2 Calibrations and Checkers; 4.3 Dealing with Measurement Error; 4.4 Basic Data Analysis; 4.5 Summary; CHAPTER 5: TESTER HARDWARE; 5.1 Mixed-Signal Tester Overview; 5.2 DC Resources; 5.3 Digital Subsystem; 5.4 AC Source and Measurement; 5.5 Time Measurement System; 5.6 Computing Hardware; 5.7 Summary; CHAPTER 6: SAMPLING THEORY; 6.1 Analog Measurements Using DSP; 6.2 Sampling and Reconstruction; 6.3 Repetitive Sample Sets; 6.4 Synchronization of Sampling Systems; 6.5 Summary; CHAPTER 7: DSP-BASED TESTING; 7.1 Advantages of DSP-Based Testing; 7.2 Digital Signal Processing; 7.3 Discrete-Time Transforms; 7.4 The Inverse FFT; 7.5 Summary; CHAPTER 8: ANALOG CHANNEL TESTING; 8.1 Overview; 8.2 Gain and Level Tests; 8.3 Phase Tests; 8.4 Distortion Tests; 8.5 Signal Rejection Tests; 8.6 Noise Tests; 8.7 Simulation of Analog Channel Tests; 8.8 Summary; CHAPTER 9: SAMPLED CHANNEL TESTING; 9.1 Overview; 9.2 Sampling Considerations; 9.3 Encoding and Decoding; 9.4 Sampled Channel Tests; 9.5 Summary; CHAPTER 10: FOCUSED CALIBRATIONS; 10.1 Overview; 10.2 DC Calibrations; 10.3 AC Amplitude Calibrations; 10.4 Other AC Calibrations; 10.5 Error Cancellation
... mehr
Techniques; 10.6 Summary; CHAPTER 11: DAC TESTING; 11.1 Basics of Converter Testing; 11.2 Basic DC Tests; 11.3 Transfer Curve Tests; 11.4 Dynamic DAC Tests; 11.5 DAC Architectures; 11.6 Summary; CHAPTER 12: ADC TESTING; 12.1 ADC Testing Versus DAC Testing; 12.2 ADC Code Edge Measurements; 12.3 DC Tests and Transfer Curve Tests; 12.4 Dynamic ADC Tests; 12.5 ADC Architectures; 12.6 Tests for Common ADC Applications; 12.7 Summary; CHAPTER 13: DIB DESIGN; 13.1 DIB Basics; 13.2 Printed Circuit Boards (PCBS); 13.3 DIB Traces, Shields, and Guards; 13.4 Transmission Lines; 13.5 Grounding and Power Distribution; 13.6 DIB Components; 13.7 Common DIB Circuits; 13.8 Common DIB Mistakes; 13.9 Summary; CHAPTER 14: DESIGN FOR TEST (DFT); 14.1 Overview; 14.2 Advantages of DfT; 14.3 Digital Scan; 14.4 Digital BIST; 14.5 Digital DfT for Mixed-Signal Circuits; 14.6 Mixed-Signal Boundary Scan and BIST; 14.7 Ad Hoc Mixed-Signal DfT; 14.8 Subtle Forms of Analog DFT; 14.9 IDDQ; 14.10 Summary; CHAPTER 15: DATA ANALYSIS; 15.1 Introduction to Data Analysis; 15.2 Data Visualization Tools; 15.3 Statistical Analysis; 15.4 Statistical Process Control (SPC); 15.5 Summary; CHAPTER 16: TEST ECONOMICS; 16.1 Profitability Factors; 16.2 Direct Testing Costs; 16.3 Debugging Skills; 16.4 Emerging Trends; 16.5 Summary
... weniger
Bibliographische Angaben
- Autoren: Mark Burns , Gordon Roberts
- 2001, 704 Seiten, Maße: 19,1 x 24 cm, Gebunden, Englisch
- Verlag: Oxford University Press
- ISBN-10: 0195140168
- ISBN-13: 9780195140163
Sprache:
Englisch
Rezension zu „Introduction To Mixed-Signal IC Test and Measurement “
"Burns and Roberts have written an excellent book fulfilling the need for a good textbook on the subject of mixed-signal test measurement." Engineering Science & Education, 2002
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