Lean Enterprise Value
Insights from MIT's Lean Aerospace Initiative
(Sprache: Englisch)
Lean Production transformed the way that companies think about production and manufacturing. This book provides a new challenge. It arises from the work of the Lean Aerospace Initiative at MIT and provides a new agenda and bold vision for the aerospace...
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Klappentext zu „Lean Enterprise Value “
Lean Production transformed the way that companies think about production and manufacturing. This book provides a new challenge. It arises from the work of the Lean Aerospace Initiative at MIT and provides a new agenda and bold vision for the aerospace industry to take it out of crisis. It also redefines and develops the concept of Lean as a framework for enterprise transformation and this will be relevant and critical for all industries and enterprises.
Inhaltsverzeichnis zu „Lean Enterprise Value “
Prologue PART I: HIGHER, FASTER, FARTHER The 21st Century Challenge The Cold War Legacy Monuments and Misalignments PART II: BETTER, FASTER, CHEAPER? Lean Thinking Islands of Success Lean Enterprises PART III: CREATING ENTERPRISE VALUE A Value Creation Framework Program Value Corporate and Government Value National and International Value Future Value: A US Aerospace Perspective
Autoren-Porträt von E. Murman, T. Allen, K. Bozdogan, Joel Cutcher-Gershenfeld, H. McManus, D. Nightingale, E. Rebentisch, Shields
The author team form the Lean Aerospace Initiative based at MIT and contain a number or outstanding academics and researchers including:EARLL M. MURMAN is Professor of Aeronautics and Astronautics and Program Director of the Lean Aerospace Initiative at Massachusetts Institute of Technology.
THOMAS J. ALLEN is Howard W Johnson Professor of Management at the Sloan School of Management, Massachusetts Institute of Technology and Co-Director of the Lean Aerospace Initiative.
JOEL CUTCHER-GERSHENFELD is Executive Director, Engineering Systems Learning Center and Senior Research Scientist, Sloan School of Management, Massachusetts Institute of Technology.
Bibliographische Angaben
- Autoren: E. Murman , T. Allen , K. Bozdogan , Joel Cutcher-Gershenfeld , H. McManus , D. Nightingale , E. Rebentisch , Shields
- 2002, 2002., 344 Seiten, Maße: 21,6 cm, Gebunden, Englisch
- Verlag: Palgrave Macmillan
- ISBN-10: 0333976975
- ISBN-13: 9780333976975
Sprache:
Englisch
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