Scan Statistics
(Sprache: Englisch)
In many statistical applications the scientists have to analyze the occurrence of observed clusters of events in time or space. The scientists are especially interested to determine whether an observed cluster of events has occurred by chance if it is...
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In many statistical applications the scientists have to analyze the occurrence of observed clusters of events in time or space. The scientists are especially interested to determine whether an observed cluster of events has occurred by chance if it is assumed that the events are distributed independently and uniformly over time or space. Applications of scan statistics have been recorded in many areas of science and technology including: geology, geography, medicine, minefield detection, molecular biology, photography, quality control and reliability theory and radio-optics.
Inhaltsverzeichnis zu „Scan Statistics “
Introduction Retrospective Scanning of Events over Time Prospective Scanning of Events over Time Success Scans in a Sequence of Trials Higher Dimensional Scans Scan Statistics in DNA Analysis Approaches Used for derivations and approximations Scanning N Uniform Distributed Points: Bounds Approximations for the Conditional Case Scanning Points in a Poisson Process The Generalized Birthday Problem Scan Statistics for a Sequence of Discrete i.i.d. Variables Power Testing for Clustering Superimposed on a Non-uniform Density Multi-dimensional Case Number of Clusters: Ordered Spacings Extensions of the Scan Statistic
Autoren-Porträt von Joseph Glaz, Joseph Naus, Sylvan Wallenstein
Joseph Glaz has been appointed (effective July 1, 2011) as head of the Department of Statistics, University of Connecticut. He has co-authored several books. Glaz is the current editor-in-chief of the following Springer journal: Methodology and Computing in Applied Probability. Honors and Awards include : election to the Connecticut Academy of Arts and Sciences (2011), elected fellow of the Institute of Mathematical Sciences (2009), AAUP Excellence in Research Award (2006), Abraham Wald Prize in Sequential Analysis (2006), elected fellow of the American Statistical Assoc. (2000), elected member of the International Statistical Institute (1999).
Most importantly, Joe Glaz has worked closely with Joseph Naus, the father of scan statistics, since this area of statistics was conceived around 1999.
Bibliographische Angaben
- Autoren: Joseph Glaz , Joseph Naus , Sylvan Wallenstein
- 2001, 2001, 372 Seiten, Maße: 16 x 24,1 cm, Gebunden, Englisch
- Verlag: Springer, New York
- ISBN-10: 038798819X
- ISBN-13: 9780387988191
- Erscheinungsdatum: 09.08.2001
Sprache:
Englisch
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