Scan Statistics

PrefaceContributorsList of TablesList of FiguresJoseph Naus: Father of the Scan Statistic S. WallensteinPrecedence-Type Test for the Comparison of Treatments with a Control N. Balakrishnan and H. K. T. NgExtreme Value Results for Scan Statistics M. V. Boutsikas, M. V. Koutras, and F. S. MilienosBoundary Crossing Probability Computations in the Analysis of Scan Statistics H. P. Chan, I-P. Tu, and N. R. ZhangApproximations for Two-Dimensional Variable Window Scan Statistics J. Chen and J. GlazApplications of Spatial Scan Statistics: A Review M. A. Costa and M. KulldorffExtensions of the Scan Statistics for the Detection and Inference of Spatial Clusters L. Duczmal, A. R. Duarte, and R. Tavares1-Dependent Stationary Sequences and Applications to Scan Statistics G. Haiman and C. PredaScan Statistics in Genome-Wide Scan for Complex Trait Loci J. Hoh and J. OttOn Probabilities for Complex Switching Rules in Sampling Inspection W. Y. W. Lou and J. C. FuBayesian Network Scan Statistics for Multivariate Pattern Detection D. B. Neill, G. F. Cooper, K. Das, X. Jiang, and J. SchneiderULS Scan Statistic for Hotspot Detection with Continuous Gamma Response G. P. Patil, S. W. Joshi, W. L. Myers, and R. E. KoliFalse Discovery Control for Scan Clustering M. Perone-Pacifico and I. VerdinelliMartingale Methods for Patterns and Scan Statistics V. Pozdnyakov and J. M. SteeleHow Can Pattern Statistics Be Useful for DNA Motif Discovery? S. Schbath and S. RobinOccurrence of Patterns and Motifs in Random Strings V. T. StefanovDetection of Disease Clustering T. TangoIndex

Joseph Glaz has been appointed (effective July 1, 2011) as head of the Department of Statistics, University of Connecticut. He has co-authored several books. Glaz is the current editor-in-chief of the following Springer journal: Methodology and Computing in Applied Probability.
Honors and Awards include : election to the Connecticut Academy of Arts and Sciences (2011), elected fellow of the Institute of Mathematical Sciences (2009), AAUP Excellence in Research Award (2006), Abraham Wald Prize in Sequential Analysis (2006), elected fellow of the American Statistical Assoc. (2000), elected member of the International Statistical Institute (1999).
Most importantly, Joe Glaz has worked closely with Joseph Naus, the father of scan statistics, since this area of statistics was conceived around 1999.

From the reviews:"The area of scan statistics has developed rapidly in recent years. ... provided excellent overviews of the area. ... There are many papers of interest here for the readers of Technometrics. ... This reviewer enjoyed thumbing through the pages of this volume and feels that the editors hope that it will serve as a valuable reference and source for researchers in applied probability and statistics and in many other areas of science and technology is well justified." (H. N. Nagaraja, Technometrics, Vol. 53 (1), February, 2011)