Reliability Physics and Engineering (PDF)
Time-To-Failure Modeling
(Sprache: Englisch)
Reliability Physics and Engineering provides critically important information that is needed for designing and building reliable cost-effective products.
Key features include:
. Materials/Device Degradation
. Degradation Kinetics
. Time-To-Failure...
Key features include:
. Materials/Device Degradation
. Degradation Kinetics
. Time-To-Failure...
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Produktinformationen zu „Reliability Physics and Engineering (PDF)“
Reliability Physics and Engineering provides critically important information that is needed for designing and building reliable cost-effective products.
Key features include:
. Materials/Device Degradation
. Degradation Kinetics
. Time-To-Failure Modeling
. Statistical Tools
. Failure-Rate Modeling
. Accelerated Testing
. Ramp-To-Failure Testing
. Important Failure Mechanisms for Integrated Circuits
. Important Failure Mechanisms for Mechanical Components
. Conversion of Dynamical Stresses into Static Equivalents
. Small Design Changes Producing Major Reliability Improvements
This textbook includes numerous example problems with solutions. Also, exercise problems along with answers are included at the end of each chapter.
Reliability Physics and Engineering can be a useful resource for students, engineers and materials scientists.
Key features include:
. Materials/Device Degradation
. Degradation Kinetics
. Time-To-Failure Modeling
. Statistical Tools
. Failure-Rate Modeling
. Accelerated Testing
. Ramp-To-Failure Testing
. Important Failure Mechanisms for Integrated Circuits
. Important Failure Mechanisms for Mechanical Components
. Conversion of Dynamical Stresses into Static Equivalents
. Small Design Changes Producing Major Reliability Improvements
This textbook includes numerous example problems with solutions. Also, exercise problems along with answers are included at the end of each chapter.
Reliability Physics and Engineering can be a useful resource for students, engineers and materials scientists.
Autoren-Porträt von J. W. McPherson
Dr. J.W. McPherson is a Texas Instruments Senior Fellow Emeritus and an IEEE Fellow. He has published approximately 200 papers on Reliability Physics and Engineering, written Reliability Chapters in four books, holds 12 patents and was a past General Chair of the International Reliability Physics Symposium. McPherson's broad reliability experience, with both electrical and mechanical failure mechanisms, makes him ideally suited to author a general textbook on Reliability Physics and Engineering.
Bibliographische Angaben
- Autor: J. W. McPherson
- 2010, 2010, 318 Seiten, Englisch
- Verlag: Springer-Verlag GmbH
- ISBN-10: 1441963480
- ISBN-13: 9781441963482
- Erscheinungsdatum: 05.08.2010
Abhängig von Bildschirmgröße und eingestellter Schriftgröße kann die Seitenzahl auf Ihrem Lesegerät variieren.
eBook Informationen
- Dateiformat: PDF
- Größe: 7.73 MB
- Ohne Kopierschutz
- Vorlesefunktion
Sprache:
Englisch
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