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Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials / NATO Science Series II: Mathematics, Physics and Chemistry Bd.186 (PDF)

Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials, Algarve, Portugal, 1 - 13 October 2002 (Sprache: Englisch)
 
 
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As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming...

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