Strain Effect in Semiconductors (PDF)
Strain Effect in Semiconductors: Theory and Device Applications presents the fundamentals and applications of strain in semiconductors and semiconductor devices that is relevant for strain-enhanced advanced CMOS technology and strain-based piezoresistive...
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Strain Effect in Semiconductors: Theory and Device Applications presents the fundamentals and applications of strain in semiconductors and semiconductor devices that is relevant for strain-enhanced advanced CMOS technology and strain-based piezoresistive MEMS transducers. The book discusses relevant applications of strain while also focusing on the fundamental physics as they pertain to bulk, planar, and scaled nano-devices. Lead authors Yongke Sun, Scott Thompson and Toshikazu Nishida also:
- Treat strain physics at both the qualitative overview level as well as provide detailed fundamentals
- Explain strain physics relevant to logic devices as well as strain-based MEMS
This book is relevant to current strained Si logic technology, as well as for understanding the physics and scaling of future strain nano-scale devices. It is perfect for practicing device engineers at semiconductor manufacturers, as well as graduate students studying device physics at universities.
- Autoren: Yongke Sun , Scott E. Thompson , Toshikazu Nishida
- 2009, 2010, 350 Seiten, Englisch
- Verlag: Springer-Verlag GmbH
- ISBN-10: 1441905529
- ISBN-13: 9781441905529
- Erscheinungsdatum: 14.11.2009
Abhängig von Bildschirmgröße und eingestellter Schriftgröße kann die Seitenzahl auf Ihrem Lesegerät variieren.
- Dateiformat: PDF
- Größe: 9.06 MB
- Ohne Kopierschutz
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