Advances in Imaging and Electron Physics
(Sprache: Englisch)
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially...
This series features extended articles on the physics of electron devices (especially...
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Produktinformationen zu „Advances in Imaging and Electron Physics “
Klappentext zu „Advances in Imaging and Electron Physics “
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Inhaltsverzeichnis zu „Advances in Imaging and Electron Physics “
A History Of Cameca Emmanuel de Chambost
Theory and Applications of General Adaptive Neighborhood Image Processing
Johan Debayle, Jean-Charles Pinoli
Shape Recognition Based on Eigenvalues of the Laplacian
M. Ben Haj Rhouma, M.A. Khabou, L. Hermi
Point Set Analysis
Nicolas Lomenie, Georges Stamon
Image recovery from sparse samples, discrete sampling theorem and sharply bounded band limited discrete signals
Leonid P. Yaroslavsky
Autoren-Porträt
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Bibliographische Angaben
- 2011, XIV, 345 Seiten, Maße: 15,9 x 23,6 cm, Gebunden, Englisch
- Herausgegeben:Hawkes, Peter W.
- Herausgegeben: Peter W. Hawkes
- Verlag: Academic Press
- ISBN-10: 0123859859
- ISBN-13: 9780123859853
Sprache:
Englisch
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