GRATIS¹ Geschenk für Sie!

Assessment and Application of Defect Characterization via Lifetime Spectroscopy in High Purity C-Si.

(Sprache: Englisch)
 
 
Merken
Merken
 
 
The performance limit of monocrystalline silicon solar cells is almost reached. Only marginal effects are limiting the excess carrier lifetime of nowadays used materials. Nonetheless it is interesting to investigate and characterize the limiting effects to...
lieferbar
versandkostenfrei

Bestellnummer: 149166299

Buch (Kartoniert) 84.00
Dekorierter Weihnachtsbaum
In den Warenkorb
  • Lastschrift, Kreditkarte, Paypal, Rechnung
  • Kostenlose Rücksendung
  • Ratenzahlung möglich
 
  •  
     
     
     
     
  •  
     
     
     
     
  •  
     
     
     
     
  •  
     
     
     
     
  •  
     
     
     
     
  •  
     
     
     
     
 
  •  
     
     
     
     
  •  
     
     
     
     
  •  
     
     
     
     
  •  
     
     
     
     
  •  
     
     
     
     
  •  
     
     
     
     
Kommentar zu "Assessment and Application of Defect Characterization via Lifetime Spectroscopy in High Purity C-Si."
 
  •  
     
     
     
     
  •  
     
     
     
     
  •  
     
     
     
     
  •  
     
     
     
     
  •  
     
     
     
     
  •  
     
     
     
     
 
  •  
     
     
     
     
  •  
     
     
     
     
  •  
     
     
     
     
  •  
     
     
     
     
  •  
     
     
     
     
  •  
     
     
     
     
0 Gebrauchte Artikel zu „Assessment and Application of Defect Characterization via Lifetime Spectroscopy in High Purity C-Si.“
Zustand Preis Porto Zahlung Verkäufer Rating