Characterization in Compound Semiconductor Processing

Name: Characterization in Compound Semiconductor Processing
Brand: Momentum Press
SKU: 22769749
Price: 93.53 EUR
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(Sprache: Englisch)

Autoren: Gary E. McGuire , Yale E. Strausser

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Compound semiconductors such as Gallium Arsenide, Gallium Aluminum Arsenide, and Indium Phosphide are often difficult to characterize and present a variety of challenges from substrate preparation, to epitaxial growth to dielectric film deposition to dopant introduction. This book reviews the common classes of compound semiconductors, their physical, optical and electrical properties and the various types of methods used for characterizing them when analyzing for defects and application problems. The book features:
Characterization of III-V Thin Films for Electronic and Optical applications
Characterization of Dielectric Insulating Film layers
A Special case study on Deep Level Transient Spectroscopy on GaAs
Concise summaries of major characterization technologies for compound semiconductor materials, including Auger Electron Spectroscopy, Ballistic Electron Emission Microscopy, Energy-Dispersive X-Ray Spectroscopy, Neutron Activation Analysis and Raman Spectroscopy

Autoren-Porträt von Gary E. McGuire, Yale E. Strausser

Garry E. McGuire

Yale E. Strausser

Bibliographische Angaben

Autoren: Gary E. McGuire , Yale E. Strausser
2010, Maße: 15,6 x 24,4 cm, Gebunden, Englisch
Verlag: Momentum Press
ISBN-10: 1606500414
ISBN-13: 9781606500415

Sprache:

Englisch

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