Core J2EE Patterns, English edition
Best Practices and Design Strategies
(Sprache: Englisch)
This is the completely updated and revised edition to the bestselling tutorial and reference to J2EE Patterns. The book introduces new patterns, new refactorings, and new ways of using XML and J2EE Web services.
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Produktinformationen zu „Core J2EE Patterns, English edition “
This is the completely updated and revised edition to the bestselling tutorial and reference to J2EE Patterns. The book introduces new patterns, new refactorings, and new ways of using XML and J2EE Web services.
Inhaltsverzeichnis zu „Core J2EE Patterns, English edition “
Foreword Grady Booch. Foreword Martin Fowler. Preface. I. PATTERNS AND J2EE. 1: Introduction. 2: Presentation Tier Design Considerations and Bad Practices. 3: Business Tier Design Considerations and Bad Practices. 4: J2EE Refactorings. II. J2EE PATTERN CATALOG. 5: J2EE Patterns Overview. 6: Presentation Tier Patterns. 7: Business Tier Patterns. 8: Integration Tier Patterns. Epilogue. Bibliography. The Apache Software License, Version 1.1 Index.
Autoren-Porträt von Deepak Alur, John Crupi, Dan Malks
DEEPAK ALUR is an Enterprise Java Architect with the Sun Java Center with over 14 years of experience. He remains focused on architecture, design, and implementation of large-scale Enterprise applications using Object-Oriented technologies, patterns, and Java and J2EE technologies. JOHN CRUPI is a Distinguished Engineer and the Chief Java Architect of the Sun Java Center. He has over 17 years of experience in distributed object computing and remains focused on creating reusable, scalable J2EE architectures and bringing patterns to the next level. DAN MALKS is a Principal Engineer with the Sun Java Center. He has over 16 years of experience and focuses on Object-Oriented technologies and their application within Enterprise and Web Services-based projects. His publications include industry periodicals and books on Java and J2EE technologies and patterns.
Bibliographische Angaben
- Autoren: Deepak Alur , John Crupi , Dan Malks
- 2003, 2nd upd. and rev. ed., XXX, 650 Seiten, Maße: 18,8 x 23,6 cm, Gebunden, Englisch
- Verlag: Sun Microsystems
- ISBN-10: 0131422464
- ISBN-13: 9780131422469
Sprache:
Englisch
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