Intermittent Failures in Integrated Circuits
Detection, Characterization and Fault Tolerance
(Sprache: Englisch)
This book presents a consolidated study of the entire class of intermittent failures by analyzing the root causes behind these errors, their efficient detection and characterization, and finally fault tolerant design techniques at various layers of...
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Klappentext zu „Intermittent Failures in Integrated Circuits “
This book presents a consolidated study of the entire class of intermittent failures by analyzing the root causes behind these errors, their efficient detection and characterization, and finally fault tolerant design techniques at various layers of abstraction (from transistor to architecture) to improve reliability of system operation in presence of intermittent errors.
This book presents a consolidated study of the entire class of intermittent failures by analyzing the root causes behind these errors, their efficient detection and characterization, and finally fault tolerant design techniques at various layers of abstraction (from transistor to architecture) to improve reliability of system operation in presence of intermittent errors.
Inhaltsverzeichnis zu „Intermittent Failures in Integrated Circuits “
Introduction.- Fundamentals of VLSI Testing.- Circuit Marginality and Noise Sources.- Fault Modeling for Intermittent Errors.- Automatic Test Pattern Generation.- Design-for-Testability.- Test Economics and Cost-Benefit Analysis.- Layout Level Fault Tolerance.- Circuit Level Fault Tolerance.- Gate Level Fault Tolerance.- System Level Fault Tolerance.- Information Level Fault Tolerance.
Autoren-Porträt von Alodeep Sanyal, Sandip Kundu, Ilia Polian
Dr. Sandip Kundu is a professor in the Electrical and Computer Engineering Department at the University of Massachusetts at Amherst, specializing in semiconductor and lithographic manufacturing.
Bibliographische Angaben
- Autoren: Alodeep Sanyal , Sandip Kundu , Ilia Polian
- 2016, 1st ed., 300 Seiten, Gebunden, Englisch
- Verlag: Springer
- ISBN-10: 1441983147
- ISBN-13: 9781441983145
- Erscheinungsdatum: 06.01.2016
Sprache:
Englisch
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