OCM 2013 - Optical Characterization of Materials - conference proceedings
The state of the art in optical characterization of materials is advancing rapidly. New insights into the theoretical foundations of this research field have been gained and exciting practical developments have taken place, both driven by novel applications...
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The state of the art in optical characterization of materials is advancing rapidly. New insights into the theoretical foundations of this research field have been gained and exciting practical developments have taken place, both driven by novel applications that are constantly emerging. This book presents latest research results in the domain of Characterization of Materials by spectral characteristics of UV (240 nm) to IR (14 µm), multispectral image analysis, X-Ray, polarimetry and microscopy.
Klappentext zu „OCM 2013 - Optical Characterization of Materials - conference proceedings “
The state of the art in optical characterization of materials is advancing rapidly. New insights into the theoretical foundations of this research field have been gained and exciting practical developments have taken place, both driven by novel applications that are constantly emerging. This book presents latest research results in the domain of Characterization of Materials by spectral characteristics of UV (240 nm) to IR (14 µm), multispectral image analysis, X-Ray, polarimetry and microscopy.
Autoren-Porträt
Prof. Dr.-Ing. Fernando Puente León lehrt und forscht seit 2008 am Institut für Industrielle Informationstechnik (IIIT) des Karlsruher Instituts für Technologie (KIT). Nach Studium und Promotion arbeitete er bei der Firma DS2 im Bereich der Modem-Entwicklung. Von 2003 bis 2008 war er als Professor für Verteilte Messsysteme an der Technischen Universität München tätig. Seine Forschungsschwerpunkte liegen in der Bild- und Signalverarbeitung, der Mess- und Automatisierungstechnik, der Informationsfusion, der Mustererkennung sowie der Architektur und Analyse verteilter Systeme.
Bibliographische Angaben
- 2013, X, 296 Seiten, mit Abbildungen, Maße: 14,8 x 21 cm, Kartoniert (TB), Deutsch
- Herausgegeben: Jürgen Beyerer
- Verlag: KIT Scientific Publishing
- ISBN-10: 3866449658
- ISBN-13: 9783866449657
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