Quantum-Well Laser Array Packaging
(Sprache: Englisch)
This book provides researchers with the most up-to-date, cutting-edge packaging techniques for nanoscale quantum-lasers.
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This book provides researchers with the most up-to-date, cutting-edge packaging techniques for nanoscale quantum-lasers.
Klappentext zu „Quantum-Well Laser Array Packaging “
Quantum-well lasers offer the promise of lightning-fast data communications 10-to-100 times faster than broadbandWhile the architecture for these devices already exists, they suffer from material packaging problems. In this book the authors address this critical issue by providing researchers with state-of-the-art screening and packaging techniques not found in any other resource.
Key features
Degradation signatures occurring in high power laser bars exposed to high optical power densities
Failure prediction for different types of laser bars and technologies
Screening methodologies in high power laser bars with a classification of detected defects
In-depth degradation analysis of bars and single emitters
Inhaltsverzeichnis zu „Quantum-Well Laser Array Packaging “
From the contents:Contributors Foreword
Chapter 1: Introduction
Chapter 2: Overview of Laser Diode Degradation Mechanisms
Chapter 3: Strain Measurement
Chapter 4: Laser Facet Inspection by Imaging Techniques
Chapter 5: Failure Prediction of High-Power Laser Bars
Chapter 6: Reduction of External Stresses by Improved Packaging Techniques
Chapter 7: Degradation Modes and Related Defects in High-Power Laser Bars
Chapter 8: Summary APPENDIX: MATERIALS PROPERTIES Index
Autoren-Porträt von J. Tomm
Jens W. Tomm (Berlin, Germany) is currently on the scientific staff of the Max-Born-Institut fr Nichtlineare Optik und Kurzzeitspektroskopie where he serves as project leader. His work is focused on spectroscopic aging analysis of high-powered diode lasers, optical spectroscopy in such optoelectronic devices as high-powered semiconductor lasers, thermal analysis of optoelectronic devices by means of Raman-spectroscopy and Microthermography, device-related near-field scanning optical microscopy (NSOM) and Fourier-Transform (FT) spectroscopy, transient photoluminescence spectroscopy in III-V semiconductors/structures, and optoelectronic device development, and IR-LEDs for the 3-5 m spectral range. Juan Jimz (Valladolid, Spain) is a Full Professor at the University of Valladolid, R&D where as group leader, he researches optical characterization of semiconductors and devices using microscopic techniques. His research has been carried out in the frame of different academic and industrial projects around the world and funded by such institutions as the Spanish government, European Union, EOARD (European Office for Aerospace Research and Development), Alcatel Optronics, and Avanex among others.
Bibliographische Angaben
- Autor: J. Tomm
- 2006, 428 Seiten, Maße: 16,2 x 23,1 cm, Gebunden, Englisch
- Herausgegeben: Jens W. Tomm, Juan Jimenez
- Verlag: McGraw-Hill Professional
- ISBN-10: 0071460322
- ISBN-13: 9780071460323
Sprache:
Englisch
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