Scanning Tunneling Microscopy/Spectroscopy and Related Techniques
12th International Conference, STM'03
(Sprache: Englisch)
At this conference the latest developments in the design, construction, and application of scanning probe microscopy like Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM), Magnetic Force Microscopy (MFM), Scanning Near-Field Optical...
Leider schon ausverkauft
versandkostenfrei
Buch
207.58 €
Produktdetails
Produktinformationen zu „Scanning Tunneling Microscopy/Spectroscopy and Related Techniques “
Klappentext zu „Scanning Tunneling Microscopy/Spectroscopy and Related Techniques “
At this conference the latest developments in the design, construction, and application of scanning probe microscopy like Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM), Magnetic Force Microscopy (MFM), Scanning Near-Field Optical Microscopy (SNOM) in the fields of nanotechnology, physics, chemistry, and biology were discussed.
Bibliographische Angaben
- 2004, 1., 2003., XVIII, 179 Seiten, Maße: 16,7 x 24,2 cm, Gebunden, Englisch
- Herausgegeben:Koenraad, P.M.; Kemerink, M.
- Herausgegeben: Paul M. Koenraad, Martijn Kemerink
- Verlag: Springer
- ISBN-10: 0735401683
- ISBN-13: 9780735401686
Sprache:
Englisch
Kommentar zu "Scanning Tunneling Microscopy/Spectroscopy and Related Techniques"
0 Gebrauchte Artikel zu „Scanning Tunneling Microscopy/Spectroscopy and Related Techniques“
Zustand | Preis | Porto | Zahlung | Verkäufer | Rating |
---|
Schreiben Sie einen Kommentar zu "Scanning Tunneling Microscopy/Spectroscopy and Related Techniques".
Kommentar verfassen