Spectrophotometry
Accurate Measurement of Optical Properties of Materials
(Sprache: Englisch)
This volume is an essential handbook for anyone interested in performing the most accurate spectrophotometric or other optical property of materials measurements. The chapter authors were chosen from the leading experts in their respective fields and...
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Klappentext zu „Spectrophotometry “
This volume is an essential handbook for anyone interested in performing the most accurate spectrophotometric or other optical property of materials measurements. The chapter authors were chosen from the leading experts in their respective fields and provide their wisdom and experience in measurements of reflectance, transmittance, absorptance, emittance, diffuse scattering, color, and fluorescence. The book provides the reader with the theoretical underpinning to the methods, the practical issues encountered in real measurements, and numerous examples of important applications.
Inhaltsverzeichnis zu „Spectrophotometry “
1. Introduction Germer, Zwinkels and Tsai 2. Theoretical concepts in spectrophotometric measurements Germer, Zwinkels and Tsai 3. Dispersive methods Gaertner, Yoon and Germer 4. Fourier transform methods Kaplan and Quijada 5. Regular reflectance and transmittance van Nijnatten 6. Diffuse reflectance and transmittance Höpe 7. Spectral fluorescence Zwinkels, DeRose and Lelan 8. Angle-resolved diffuse reflectance and scattering Germer, Stover and Schröder 9. Spectral emissivity measurements Watanabe, Ishii, Wakabayashi, Kumano, and Hanssen 10. Color and appearance Nadal, Wyble and Zarobila 11. The use of spectrophotometry in the pharmaceutical industry Hammond 12. Spectrophotometry applications: Remote sensing Bruegge, Davies, Schwandner, and Seidel 13. Microspectrophotometry Martin and Eyring
Autoren-Porträt
Thomas A. Germer received a B.A. in physics from the University of California, Berkeley in 1985. In 1992, he received a Ph.D. in physics from Cornell University in the field of surface electron spectroscopies and surface photochemistry. An interest in optics at surfaces led him to the National Institute of Standards and Technology (NIST), where he held a postdoctoral associateship from 1992 to 1995, performing research in picosecond and femtosecond time-resolved measurements of surface chemical and physical dynamics. He joined the NIST staff as a physicist in the 1995. Since then, he has led the NIST program on light scattering and diffraction from surfaces. His work has earned him the Department of Commerce Bronze and Silver awards, The NIST Chapter of Sigma Xi Young Scientist Award, and Fellow of the SPIE, and he has served as a topical editor for Applied Optics. He has published over 100 articles and has been granted two patents. He developed the SCATMECH library of scattering codes.Dr. Joanne Zwinkels was a Principal Research Officer at the National Research Council of Canada (NRC), retired since February 2020. She received her PhD in Physical Chemistry from the University of Alberta (1983). She joined the NRC Division of Physics in 1984 to work in the field of spectrophotometry. In 2006, she received the NRC Outstanding Achievement Award and in 2010 she received the Inter-Society Color Council Macbeth Award. Joanne is actively involved in international standardization activities and served more than a decade as the NRC representative to the Consultative Committee of Photometry and Radiometry (CCPR), Chair of the Strategic Planning Working Group of CCPR, and International Convenor of ISO TC6/WG3. In retirement, she works as an NRC Independent Visitor and serves as Associate Director of the International Commission on Illumination (CIE) for Division 2 (Physical Measurement of Light and Radiation) and on the Engineering Research Express Editorial Board.
Bibliographische Angaben
- 2014, 560 Seiten, Gebunden, Englisch
- Herausgegeben:Germer, Thomas A.; Zwinkels, Joanne C.; Tsai, Benjamin K.
- Verlag: Academic Press
- ISBN-10: 0123860229
- ISBN-13: 9780123860224
Sprache:
Englisch
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