Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs
(Sprache: Englisch)
Providing readers with systematic treatments of statistical modeling and analysis of VLSI systems, this volume presents the latest developments in the field. Readers will find an analysis of each algorithm with practical applications in the context of real circuit design.
Leider schon ausverkauft
versandkostenfrei
Buch
101.60 €
50 DeutschlandCard Punkte
sammeln
- Lastschrift, Kreditkarte, Paypal, Rechnung
- Kostenlose Rücksendung
- Ratenzahlung möglich
Produktdetails
Produktinformationen zu „Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs “
Providing readers with systematic treatments of statistical modeling and analysis of VLSI systems, this volume presents the latest developments in the field. Readers will find an analysis of each algorithm with practical applications in the context of real circuit design.
Klappentext zu „Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs “
Since process variation and chip performance uncertainties have become more pronounced as technologies scale down into the nanometer regime, accurate and efficient modeling or characterization of variations from the device to the architecture level have become imperative for the successful design of VLSI chips.This book presents the latest developments for modeling and analysis of VLSI systems in the presence of process variations at the nanometer scale. It focuses on statistical interconnect modeling, statistical parasitic extractions, statistical full-chip leakage and dynamic power analysis considering spatial correlations, statistical analysis and modeling for large global interconnects and analog/mixed-signal circuits.
Inhaltsverzeichnis zu „Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs “
Introduction; Fundamentals of Statistical Analysis; Statistical Full-Chip Leakage Power Analysis; Statistical Full-Chip Dynamic Power Analysis; Statistical Parasitic Extraction; Statistical Compact Modeling and Reduction of Interconnects; Statistical Analysis of Global Interconnects; Statistical Analysis and Modeling for Analog and Mixed-Signal Circuits.
Bibliographische Angaben
- Autor: Ruijing Shen
- 2012, X, 240 Seiten, 100 Schwarz-Weiß-Abbildungen, 100 Abbildungen, Maße: 15,5 cm, Gebunden, Englisch
- Verlag: Springer Berlin
- ISBN-10: 1441967354
- ISBN-13: 9781441967350
Sprache:
Englisch
Kommentar zu "Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs"
0 Gebrauchte Artikel zu „Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs“
| Zustand | Preis | Porto | Zahlung | Verkäufer | Rating |
|---|
Schreiben Sie einen Kommentar zu "Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs".
Kommentar verfassen