The Random Coupling Model
- A Wave-Chaotic Approach to Predicting and Measuring Electromagnetic Field Quantities in Complicated Enclosures
(Sprache: Englisch)
Characterizing the nature of short-wavelength electromagnetic (EM) field quantities within large complicated enclosures poses a significant challenge in the field of microwave engineering. This problem manifests itself in many situations such as...
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Characterizing the nature of short-wavelength electromagnetic (EM) field quantities within large complicated enclosures poses a significant challenge in the field of microwave engineering. This problem manifests itself in many situations such as cellular-signal penetration into buildings, specious EM emissions from personal electronic devices inside aircrafts, or the upset of electronic systems due to intentional EM interference threats. In many such cases, the inherent complexity of the enclosure makes a deterministic solution of the internal EM field quantities infeasible, and instead calls for a statistical approach to describe the nature of these quantities. The Random Coupling Model is such a statistical approach and is discussed in this book. The Random Coupling Model treats the enclosure as a wave-chaotic system and predicts "universal" wave-fluctuations whose properties depend only upon the value of a single loss-parameter. The predictions of this model are experimentallyvalidated, and the insights gained suggest design-guidelines for EM-hardening of enclosures to the disruptive effects produced by short-wavelength EM radiation.
Autoren-Porträt von SAMEER HEMMADY
HEMMADY SAMEERearned his M.S & Ph.D in Electrical Engineering from the Univ. of Maryland-College Park. As Senior Scientist at SAIC, he currently assists the US Air Force Research Labs in High Power Microwave effects. Dr. Hemmady is also a Research Faculty at the Univ. of New Mexico. His research interests include antenna design,radars & electronic warfare.
Bibliographische Angaben
- Autor: SAMEER HEMMADY
- 2008, 272 Seiten, Maße: 22 cm, Kartoniert (TB), Englisch
- Verlag: VDM Verlag Dr. Müller e.K.
- ISBN-10: 3639088182
- ISBN-13: 9783639088182
Sprache:
Englisch
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