Electronic Thin-Film Reliability (PDF)

(Sprache: Englisch)

Autor: King-Ning Tu

Schreiben Sie einen Kommentar zu "Electronic Thin-Film Reliability".

Electronic Thin-Film Reliability, King-Ning Tu

Merken

Mehr zum Inhalt Video

Leider schon ausverkauft

Bestellnummer: 60853366

eBook

Download bestellen

1°P pro 2 € Warenwert

Lastschrift, Kreditkarte, Paypal, Rechnung
Kostenloser tolino webreader

Produktdetails

Produktbeschreibung
eBook Hilfe
Biblio. Angaben / Produktdetails

Produktinformationen zu „Electronic Thin-Film Reliability (PDF)“

Thin films are widely used in the electronic device industry. As the trend for miniaturization of electronic devices moves into the nanoscale domain, the reliability of thin films becomes an increasing concern. Building on the author's previous book, Electronic Thin Film Science by Tu, Mayer and Feldman, and based on a graduate course at UCLA given by the author, this new book focuses on reliability science and the processing of thin films. Early chapters address fundamental topics in thin film processes and reliability, including deposition, surface energy and atomic diffusion, before moving onto systematically explain irreversible processes in interconnect and packaging technologies. Describing electromigration, thermomigration and stress migration, with a closing chapter dedicated to failure analysis, the reader will come away with a complete theoretical and practical understanding of electronic thin film reliability. Kept mathematically simple, with real-world examples, this book is ideal for graduate students, researchers and practitioners.