Handbook of Nanoscopy (PDF)

General Introduction From the Past to the Future VOLUME I: Methods LIGHT MICROSCOPY Fundamentals of Light Microscopy Optical Contrasting of Microstructures Near-Field Optical Microscopy X-RAY MICROSCOPY Soft X-Ray Imaging X-Ray Microtomography and X-Ray Topography MAGNETIC MICROSCOPY NMR Imaging FIELD ION MICROSCOPY Field Emission and Field Ion Microscopy SCANNING POINT PROBE TECHNIQUES Scanning Probe Microscopy Atomic Force Microscopy ELECTRON MICROSCOPY: STATIONARY BEAM METHODS Transmission Electron Microscopy (TEM) High-Resolution TEM Aberration-Corrected High Resolution Microscopy Electron Energy Loss Spectroscopy Imaging Low Energy Electron Microscopy Lorentz Microscopy Electron Holography Methods Electron Tomography In-Situ TEM Nanolab Dynamic TEM SCANNING BEAM METHODS Scanning Electron Microscopy and Scanning Ion Microscopy Focused Ion Beam Microscopy Scanning Transmission Electron Microscopy: Z Contrast Composition Mapping Imaging Secondary Ion Mass Spectroscopy IMAGE RECORDING, HANDLING AND PROCESSING Image Recording in Microscopy Image Processing Statistical Parameter Estimation VOLUME 2: Applications Metals and Alloys Minerals and Geological Materials Ferroic Materials Grain Boundaries and Structural Ceramics Non-Periodic Structures and Amorphous Materials Quasi-Crystalline Materials Carbon Polymers and Monomeric Analogs Magnetic Materials Small Particles Preparation Techniques for Transmission Electron Microscopy Catalytic Materials and Porous Materials Nanowires and Nanotubes Biomaterials Complex Oxides Energy Materials Surfaces and Interfaces Polymers Semiconductors and Semiconducting Devices Optoelectronic and Spintronics Materials

Gustaaf Van Tendeloo studied physics and graduated from the University of Antwerp in 1974. He is now a professor at the University of Antwerp (UA) and part time professor at the University of Brussels (VUB). His research focuses on the applications of electron microscopy to different aspects of materials science. He is the author of 700 publications with over 16 000 citations to his work. Professor Van Tendeloo is the head of the electron microscopy group EMAT and director of the "Nano Center of Excellence" of the University. In 2009, he received an ERC
Advanced Grant.

Dirk Van Dyck is professor in physics and honorary vice-rector for research at the University of Antwerp. He graduated from the University of Antwerp in 1976 and spent his career at this University. Professor Van Dyck and has authored over 300 scientific publications in international
journals and was invited speaker at numerous conferences on electron microscopy and image processing. He was one of the co-editors of the Handbook of Microscopy. He received the Honory Franqui Chair of the University of Leuven and holds a Honorary Doctorship of the University of Lima.

Stephen J. Pennycook is a Corporate Fellow in the Materials Science and Technology Division at Oak Ridge National Laboratory and leader of the Scanning Transmission Electron Microscopy Group. He graduated from the University of Cambridge in 1975, moving to Oak Ridge
National Laboratory in 1982. Professor Pennycook has authored over 380 scientific publications in international journals and was invited speaker at over 200 conferences. He is a member of the editorial boards of four journals and a fellow of five professional societies. For his work on Z-contrast microscopy he was awarded the Materials Research Society Medal and the Thomas Young Medal of the Institute of Physics.

Dieses eBook können Sie uneingeschränkt auf allen Geräten der tolino Familie lesen. Zum Lesen auf sonstigen eReadern und am PC benötigen Sie eine Adobe ID.