Measurement and Modeling of Silicon Heterostructure Devices (ePub)
(Sprache: Englisch)
When you see a nicely presented set of data, the natural response is: "e;How did they do that; what tricks did they use; and how can I do that for myself?"e; Alas, usually, you must simply keep wondering, since such tricks-of- the-trade are usually...
sofort als Download lieferbar
eBook (ePub)
54.49 €
27 DeutschlandCard Punkte
sammeln
- Lastschrift, Kreditkarte, Paypal, Rechnung
- Kostenloser tolino webreader
Produktdetails
Produktinformationen zu „Measurement and Modeling of Silicon Heterostructure Devices (ePub)“
When you see a nicely presented set of data, the natural response is: "e;How did they do that; what tricks did they use; and how can I do that for myself?"e; Alas, usually, you must simply keep wondering, since such tricks-of- the-trade are usually held close to the vest and rarely divulged. Shamefully ignored in the technical literature, measurement and modeling of high-speed semiconductor devices is a fine art. Robust measuring and modeling at the levels of performance found in modern SiGe devices requires extreme dexterity in the laboratory to obtain reliable data, and then a valid model to fit that data. Drawn from the comprehensive and well-reviewed Silicon Heterostructure Handbook, this volume focuses on measurement and modeling of high-speed silicon heterostructure devices. The chapter authors provide experience-based tricks-of-the-trade and the subtle nuances of measuring and modeling advanced devices, making this an important reference for the semiconductor industry. It includes easy-to-reference appendices covering topics such as the properties of silicon and germanium, the generalized Moll-Ross relations, the integral charge-control model, and sample SiGe HBT compact model parameters.
Autoren-Porträt von John D. Cressler
John D. Cressler
Bibliographische Angaben
- Autor: John D. Cressler
- 2018, 200 Seiten, Englisch
- Verlag: Taylor & Francis
- ISBN-10: 1351834762
- ISBN-13: 9781351834766
- Erscheinungsdatum: 03.10.2018
Abhängig von Bildschirmgröße und eingestellter Schriftgröße kann die Seitenzahl auf Ihrem Lesegerät variieren.
eBook Informationen
- Dateiformat: ePub
- Größe: 7.27 MB
- Mit Kopierschutz
- Vorlesefunktion
Sprache:
Englisch
Kopierschutz
Dieses eBook können Sie uneingeschränkt auf allen Geräten der tolino Familie lesen. Zum Lesen auf sonstigen eReadern und am PC benötigen Sie eine Adobe ID.
Kommentar zu "Measurement and Modeling of Silicon Heterostructure Devices"
0 Gebrauchte Artikel zu „Measurement and Modeling of Silicon Heterostructure Devices“
| Zustand | Preis | Porto | Zahlung | Verkäufer | Rating |
|---|
Schreiben Sie einen Kommentar zu "Measurement and Modeling of Silicon Heterostructure Devices".
Kommentar verfassen