Optical Measurement of Surface Topography (PDF)

Name: Optical Measurement of Surface Topography
Brand: Springer-Verlag GmbH
SKU: 30635899
Price: 223.63 EUR
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(Sprache: Englisch)

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The measurement and characterisation of surface topography is crucial to modern manufacturing industry. The control of areal surface structure allows a manufacturer to radically alter the functionality of a part. Examples include structuring to effect fluidics, optics, tribology, aerodynamics and biology. To control such manufacturing methods requires measurement strategies. There is now a large range of new optical techniques on the market, or being developed in academia, that can measure areal surface topography. Each method has its strong points and limitations. The book starts with introductory chapters on optical instruments, their common language, generic features and limitations, and their calibration. Each type of modern optical instrument is described (in a common format) by an expert in the field. The book is intended for both industrial and academic scientists and engineers, and will be useful for undergraduate and postgraduate studies.

Autoren-Porträt

Professor Richard Leach works at National Physical Laboratory,Teddington, UK, since 1990. He is a visiting Professor of the Wolfson School for Mechanical and Manufacturing Engineering, Loughborough University. His current position is Principal Research Scientist in the Mass & Dimensional Group, Industry & Innovation Division. He is the lead scientist on three DIUS National Measurement System Engineering Measurement Programme projects: areal surface texture and structured surfaces metrology, development of low force transfer artefacts and probes for micro-coordinate measuring machines. He is also lead scientist on projects funded by DIUS Measurement for Innovators (MfI), EPSRC and EU. Professor Leach is the Measurement Service Manager for the Engineering Nanometrology Measurement Service at NPL.

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Bibliographische Angaben

2011, 2011, 323 Seiten, Englisch
Herausgegeben: Richard Leach
Verlag: Springer-Verlag GmbH
ISBN-10: 3642120121
ISBN-13: 9783642120121
Erscheinungsdatum: 31.03.2011

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Dateiformat: PDF
Größe: 17 MB
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Englisch

Pressezitat

From the reviews:“This book shows how optical microscopy can be used in the characterization and metrology of various surfaces. … Several important methods are presented in a clear and simple way … . The case studies scattered throughout the text greatly improve the readability and contribute to the practical emphasis of this book. … the index is comprehensive. I recommend this book to anyone trying to find the most appropriate method for surface topography measurement, as well as researchers who are new to using microscopy for measurements.” (Dejan Pantelić, Optics & Photonics News, December, 2011)

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