Scanning Transmission Electron Microscopy Of Nanomaterials: Basics Of Imaging And Analysis (ePub)
Basics of Imaging and Analysis
(Sprache: Englisch)
The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the...
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The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials.Contents:
Introduction (N Tanaka)
Historical Survey of the Development of STEM Instruments (N Tanaka)
Basic Knowledge of STEM:
Basics of STEM (N Tanaka and K Saitoh)
Application of STEM to Nanomaterials and Biological Specimens (N Shibata, S D Findlay, Y Ikuhara and N Tanaka)
Theories of STEM Imaging:
Theory for HAADF-STEM and Its Image Simulation (K Watanabe)
Theory for Annular Bright Field STEM Imaging (S D Findlay, N Shibata and Y Ikuhara)
Electron Energy-Loss Spectroscopy in STEM and Its Imaging (K Kimoto)
Density Functional Theory for ELNES in STEM-EELS (T Mizoguchi)
Advanced Methods in STEM:
Aberration Correction in STEM (H Sawada)
Secondary Electron Microscopy in STEM (H Inada and Y Zhu)
Scanning Confocal Electron Microscopy (K Mitsuishi and M Takeguchi)
Electron Tomography in STEM (N Tanaka)
Electron Holography and Lorentz Electron Microscopy in STEM (N Tanaka)
Recent Topics and Future Prospects in STEM (N Tanaka)
Readership: Graduate students and researchers in the field of nanomaterials and nanostructures.Key Features:
Most advanced; befitting beginning graduate students
Very convenient for advanced researchers who would like to use STEM and have a comprehensive understanding of the theory of image contrast and application details
Spans from the basic theory to the applications of STEM
Introduction (N Tanaka)
Historical Survey of the Development of STEM Instruments (N Tanaka)
Basic Knowledge of STEM:
Basics of STEM (N Tanaka and K Saitoh)
Application of STEM to Nanomaterials and Biological Specimens (N Shibata, S D Findlay, Y Ikuhara and N Tanaka)
Theories of STEM Imaging:
Theory for HAADF-STEM and Its Image Simulation (K Watanabe)
Theory for Annular Bright Field STEM Imaging (S D Findlay, N Shibata and Y Ikuhara)
Electron Energy-Loss Spectroscopy in STEM and Its Imaging (K Kimoto)
Density Functional Theory for ELNES in STEM-EELS (T Mizoguchi)
Advanced Methods in STEM:
Aberration Correction in STEM (H Sawada)
Secondary Electron Microscopy in STEM (H Inada and Y Zhu)
Scanning Confocal Electron Microscopy (K Mitsuishi and M Takeguchi)
Electron Tomography in STEM (N Tanaka)
Electron Holography and Lorentz Electron Microscopy in STEM (N Tanaka)
Recent Topics and Future Prospects in STEM (N Tanaka)
Readership: Graduate students and researchers in the field of nanomaterials and nanostructures.Key Features:
Most advanced; befitting beginning graduate students
Very convenient for advanced researchers who would like to use STEM and have a comprehensive understanding of the theory of image contrast and application details
Spans from the basic theory to the applications of STEM
Bibliographische Angaben
- 2014, 616 Seiten, Englisch
- Herausgegeben: Nobuo Tanaka
- Verlag: Imperial College Press
- ISBN-10: 1783264713
- ISBN-13: 9781783264711
- Erscheinungsdatum: 21.08.2014
Abhängig von Bildschirmgröße und eingestellter Schriftgröße kann die Seitenzahl auf Ihrem Lesegerät variieren.
eBook Informationen
- Dateiformat: ePub
- Größe: 27 MB
- Mit Kopierschutz
Sprache:
Englisch
Kopierschutz
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