Surface Scattering Experiments with Conduction Electrons / Springer Tracts in Modern Physics Bd.128 (PDF)
(Sprache: Englisch)
Surface Scattering Experiments with Conduction Electrons
shows how this process can be used to investigate surface
processes of thin metal films. Since a thin film is in one
direction of a size comparable to the mean free path of the
conduction...
shows how this process can be used to investigate surface
processes of thin metal films. Since a thin film is in one
direction of a size comparable to the mean free path of the
conduction...
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Surface Scattering Experiments with Conduction Electrons
shows how this process can be used to investigate surface
processes of thin metal films. Since a thin film is in one
direction of a size comparable to the mean free path of the
conduction electrons, such a film is both substrate and
sensor and must be characterized by other surface-analytical
methodsas demonstrated here. Also discussed is how the
dc-resistivity measurement permits the study of surface
processes such as adsorption, desorption, and surface
diffusion up to crystalline growth. The in situ observation
of epitaxial growth is additionally shown to be possible.
Thus the electronic structure of superimposed metal films
and superlattices can be elucidated. This is an essential
topic for all surface physicists.
shows how this process can be used to investigate surface
processes of thin metal films. Since a thin film is in one
direction of a size comparable to the mean free path of the
conduction electrons, such a film is both substrate and
sensor and must be characterized by other surface-analytical
methodsas demonstrated here. Also discussed is how the
dc-resistivity measurement permits the study of surface
processes such as adsorption, desorption, and surface
diffusion up to crystalline growth. The in situ observation
of epitaxial growth is additionally shown to be possible.
Thus the electronic structure of superimposed metal films
and superlattices can be elucidated. This is an essential
topic for all surface physicists.
Bibliographische Angaben
- Autor: Dieter Schumacher
- 2007, 1993, 97 Seiten, Englisch
- Verlag: Springer Berlin Heidelberg
- ISBN-10: 3540474749
- ISBN-13: 9783540474746
- Erscheinungsdatum: 17.09.2007
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- Größe: 9.09 MB
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Sprache:
Englisch
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