Built-in-Self-Test and Digital Self-Calibration for RF SoCs / SpringerBriefs in Electrical and Computer Engineering (PDF)
(Sprache: Englisch)
This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in...
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Produktinformationen zu „Built-in-Self-Test and Digital Self-Calibration for RF SoCs / SpringerBriefs in Electrical and Computer Engineering (PDF)“
This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mmWave ICs which will enable successful manufacturing of such microchips in high volume.
Bibliographische Angaben
- Autoren: Sleiman Bou-Sleiman , Mohammed Ismail
- 2011, 2012, 89 Seiten, Englisch
- Verlag: Springer-Verlag GmbH
- ISBN-10: 144199548X
- ISBN-13: 9781441995483
- Erscheinungsdatum: 23.09.2011
Abhängig von Bildschirmgröße und eingestellter Schriftgröße kann die Seitenzahl auf Ihrem Lesegerät variieren.
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- Dateiformat: PDF
- Größe: 1.82 MB
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Sprache:
Englisch
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