Advances in Imaging and Electron Physics
(Sprache: Englisch)
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.This series features extended articles on the physics of electron devices (especially...
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Klappentext zu „Advances in Imaging and Electron Physics “
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Contributions from leading international scholars and industry experts Discusses hot topic areas and presents current and future research trends Invaluable reference and guide for physicists, engineers and mathematicians
Inhaltsverzeichnis zu „Advances in Imaging and Electron Physics “
1. 2D Fourier Transforms in Polar Coordinates Natalie Baddour 2. Superluminal, subluminal, and negative velocities in free-space electromagnetic propagation Neil V. Budko 3. Chromatic aberration correction - the next step in electron microscopy Rowan Leary and Rik Brydson 4. Methods for vectorial analysis and imaging in high-resolution laser microscopy Michele Marrocco 5. Image Hierarchy in Gaussian Scale Space Tomoya Sakai1, Masaki Narita, Takuto, Komazaki, Haruhiko Nishiguchi, Atsushi Imiya 6. The Theory of the Boundary Diffraction Wave Yusuf Ziya Umul 7. History and Solution of the Phase Problem in the Theory of Structure Determination of Crystals from X-ray Di_raction Measurements Emil Wolf
Autoren-Porträt
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Bibliographische Angaben
- 2011, 360 Seiten, Maße: 16,1 x 23,5 cm, Gebunden, Englisch
- Herausgegeben:Hawkes, Peter W.
- Herausgegeben: Peter W. Hawkes
- Verlag: Academic Press
- ISBN-10: 0123858615
- ISBN-13: 9780123858610
Sprache:
Englisch
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