Applied Scanning Probe Methods V.Vol.5
The volumes V, VI and VII will examine the physical and technical foundation for recent progress in applied scanning probe techniques. These volumes constitute a timely comprehensive overview of SPM applications. This is the first book summarizing the...
The volumes V, VI and VII will examine the physical and technical foundation for recent progress in applied scanning probe techniques. These volumes constitute a timely comprehensive overview of SPM applications. This is the first book summarizing the state-of-the-art of this technique. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.
- Yasuhisa Ando: Electrostatic Microscanner
- Tilman E. Schäffer: Low-NoiseMethods for Optical Measurements of Cantilever Deflections
- Hendrik Hšolscher, Daniel Ebeling, Udo D. Schwarz: Q-controlled Dynamic Force Microscopy in Air and Liquids
- Hideki Kawakatsu: High-Frequency Dynamic Force Microscopy
- Chanmin Su, Lin Huang, Craig B. Prater, Bharat Bhushan: Torsional ResonanceMicroscopy and Its Applications
- Yaxin Song, Bharat Bhushan: Modeling of Tip-Cantilever Dynamics in Atomic Force Microscopy
- Justyna Wiedemair, Boris Mizaikoff, Christine Kranz: Combined Scanning Probe Techniques for In-Situ Electrochemical Imaging at a Nanoscale
- Pietro Giuseppe Gucciardi, Sebastiano Trusso, Cirino Vasi, Salvatore Patanè, Maria Allegrini: Near-Field Raman Spectroscopy and Imaging
- 2006, XLV, 344 Seiten, Maße: 15,9 x 24,3 cm, Gebunden, Englisch
- Herausgegeben: Bharat Bhushan, Harald Fuchs, Satoshi Kawata
- Verlag: Springer, Berlin
- ISBN-10: 3540373152
- ISBN-13: 9783540373155
- Erscheinungsdatum: 18.10.2006
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