Charge-Trapping Non-Volatile Memories
Volume 2--Emerging Materials and Structures
(Sprache: Englisch)
This book describes the technology of charge-trapping non-volatile memories and their uses. The authors explain the device physics of each device architecture and provide a concrete description of the materials involved and the fundamental properties of the...
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Klappentext zu „Charge-Trapping Non-Volatile Memories “
This book describes the technology of charge-trapping non-volatile memories and their uses. The authors explain the device physics of each device architecture and provide a concrete description of the materials involved and the fundamental properties of the technology. Modern material properties, used as charge-trapping layers, for new applications are introduced.- Provides a comprehensive overview of the technology for charge-trapping non-volatile memories;
- Details new architectures and current modeling concepts for non-volatile memory devices;
- Focuses on conduction through multi-layer gate dielectrics stacks.
Inhaltsverzeichnis zu „Charge-Trapping Non-Volatile Memories “
Materials and Device Reliability in SONOS Memories.- Charge-Trap-Non-Volatile Memory and Focus on Flexible Flash Memory Devices.- Hybrid Memories Based on Redox Molecules.- Organic Floating-Gate Memory Structures.- Nanoparticles Based Flash-like Non Volatile Memories: Cluster Beam Synthesis of Metallic Nanoparticles and Challenges for the Overlying Control Oxide Layer.
Autoren-Porträt
Panagiotis Dimitrakis is at the Institute of Advanced Materials Physicochemical Processes Nanotechnology & Microsystems at the National Centre for Scientific Research, Greece.
Bibliographische Angaben
- 2018, Softcover reprint of the original 1st ed. 2017, V, 211 Seiten, 117 farbige Abbildungen, Maße: 15,5 x 23,5 cm, Kartoniert (TB), Englisch
- Herausgegeben: Panagiotis Dimitrakis
- Verlag: Springer, Berlin
- ISBN-10: 3319839993
- ISBN-13: 9783319839998
Sprache:
Englisch
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