ICP Emission Spectrometry

OVERVIEW Analytic features of the ICP OES ICP OES - definitions Distribution of the ICP emission spectrometers Complimentary techniques for elemental analysis MIP and LIPS Symbols, abbreviations and acronyms used PLASMA The analytically used plasma Argon Added gases (e.g. Oxygen or Nitrogen) Materials used for ICP torches Orientation of the plasma (e.g. vertical vs. horizontal) Excitation to emit electromagnetic radiation High-frequency generator Sample introduction system Nebulizers OPTICS AND DETECTOR OF THE SPECTROMETER Principles of optics Detector Emission spectrometer mounts Scanning Array Spectrometers Simultaneous Array Spectrometers METHOD DEVELOPMENT Wavelength selection Reference to NIST-Atlas Processing and correction techniques Non-spectral interferences Optimization Validation Procedure to check linearity ROUTINE ANALYSIS Preliminary steps Calibration Quality control Software and data management TROUBLE SHOOTING APPLICATIONS General Notes Notes on specific elements Selected applications INSTRUMENT PURCHASING AND LABORATORY PREPARATION Which technique in atomic spectrometry is preferred? Which ICP emission spectrometer is best for the application? Preparation of the laboratory LITERATURE INDEX

Joachim Nölte studied and completed his PhD degree in environmental analysis at the University of Hamburg, Germany. His work has focussed on ICP OES since 1981 and he has worked at Perkin Elmer on method development. He has extensive experience in teaching the method through courses and presentations. In 2000 he founded a consulting agency called AnalytikSupport.