Microhardness of Metals and Semiconductors
(Sprache: Englisch)
In our earlier monograph "Mlcrohardness of Metals" [1], published in 1962, we attempted to correlate a variety of investigations scattered throughout a number of journals with the gen eral theme of solving problems of physicochemical analysis and...
Voraussichtlich lieferbar in 3 Tag(en)
versandkostenfrei
Buch (Kartoniert)
53.49 €
26 DeutschlandCard Punkte
sammeln
- Lastschrift, Kreditkarte, Paypal, Rechnung
- Kostenlose Rücksendung
- Ratenzahlung möglich
Produktdetails
Produktinformationen zu „Microhardness of Metals and Semiconductors “
Klappentext zu „Microhardness of Metals and Semiconductors “
In our earlier monograph "Mlcrohardness of Metals" [1], published in 1962, we attempted to correlate a variety of investigations scattered throughout a number of journals with the gen eral theme of solving problems of physicochemical analysis and metallography by microhard ness measurements. The publication of "Microhardness of Metals" promoted the widespread use of this tech nique in studying physicochemical phenomena in various materials. In recent years the micro hardness method has been used most extensively in studying semiconducting materials, and this has necessitated the revision of the monograph with the aim of incorporating new experi mental data relating to both metals and semiconductors. The greater proportion of the material presented in this book reflects the authors' own investigations. other investtgations associated with the use of the microhardness method in tOO physicochemical analysis of metallic and semiconducting systems are also taken into account. The authors are extremely indebted to Academician G. G. Urazov for his great interest in this work at its inception and for a number of valuable comments regarding the possibility of using the microhardness technique in physicochemical analysis. Sincere thanks are extended to Academician A. A. Bochvar and Professors A. N. Krestov nikov, M. M. Khrushchov, M. V. Mal'tsev, M. V. Zakharov, and I. I. Novikov for their interest in these investigations.
Inhaltsverzeichnis zu „Microhardness of Metals and Semiconductors “
1. Apparatus and Method of Measuring Microhardness.- The PMT-3 Apparatus.- Determining the Scale of Microscope Magnification.- Adjusting and Calibrating the Apparatus.- Measuring the Diagonal of the Impression and Determining the Value of the Microhardness.- Some Special Cases of Using the Devices for Measuring Microhardness.- 2. Techniques of Determining Microhardness.- Evaluating the Object and Choosing the Point for Studying Microhardness.- Choice of Load.- Choice of Loading Time and Period under Load.- Measuring Microhardness with Automatic Sample Loading.- Effect of Vibrations on Microhardness.- Estimating Errors in Measuring Microhardness.- 3. Method of Preparing Samples for Study.- Effect of Structure.- Effect of the Particular State of the Surface Layer.- Chemical Treatment of the Surface of Microsections.- 4. Aspects of the Method of Measuring the Microhardness of Semiconductors.- Anisotropy of Microhardness.- Dislocation Density.- Microbrittleness.- 5. Relation between the Microhardness of Solid-Solution Crystals and the Composition of the Alloy in Two-Component Systems.- Theoretical Microhardness/Composition Relation in Two-Component Systems.- The Microhardness Method in Plotting Limited-Solubility Curves on Phase Diagrams of Two-Component Systems.- The Microhardness Method in Plotting Solidus Lines on the Phase Diagrams of Two-Component Systems.- Microhardness in Two-Component Semiconducting Systems.- Determining Ranges of Homogeneity Based on Semiconducting Compounds, Using the Microhardness Method.- Distribution of Alloying (Doping) Elements in the Production of Single Crystals.- Study of Diffusion Processes in Alloys.- 6. Use of the Microhardness Method in Studying the Phase Diagrams and Structure of Three-Component Alloys.- Some Theoretical Premises.- Construction of a Limited-Solubility Surface and a Solidus Surface.- Effect of the Deviations of the Sections Studied from the Conodes on the Character of the Microhardness/Composition Relationships.-
... mehr
Additivity of the Microhardness Increment in the Form-Ternary and More Complex Solid Solutions.- Use of the Microhardness Method in Plotting Conodes in Two-Phase Regions of Ternary Phase Diagrams.- Chemical Interaction between Alloying Components in Ternary Solid Solutions Based on Metals and Semiconductors.- 7. Use of the Microhardness Method in Studying the Phase Diagrams of Quaternary Systems.- Plotting the Boundaries between Phase Regions in Quaternary Systems.- Plotting Conodes in the Two-Phase Volumes of Quaternary Phase Diagrams.- 8. Use of the Microhardness Method for Studying Liquation Phenomena in Alloys.- Essence of the Phenomena of Dendritic Liquation and Indicators of the Chemical Microinhomogeneity of Alloys.- Study of Chemical Microinhomogeneity in Alloys by the Microhardness Method.- Dependence of the Indicators of Chemical Microinhomogeneity in Alloys on the Rate of Cooling during Crystallization.- Kinetic Characteristics of Dendritic Liquation in Metallic Alloys.- Effect of the Superheating of the Melt on the Development of Liquation Microinhomogeneities in Alloys.- Crystallization Effect in the Quenching of Alloys from the Region of the Intermediate Solid-Liquid State.- 9. Microheterogenization of Solid-Solution Crystals in Two-Phase Alloys.- Relation between the Microhardness of Solid-Solution Crystals and the Composition of the Two-Phase Alloys.- Two Mechanisms of the Microheterogenization of Solid-Solution Crystals in Two-Phase Alloys.- Possible Existence of a Third Mechanism for the Microheterogenization of Solid-Solution Crystals in Two-Phase Alloys.- Effect of Cooling Rate on the Microhardness of Heterogenized Solid-Solution Crystals of Two-Phase Alloys.- Kinetics of the Transformation of Quasihomogeneous Solid-Solution Crystals of Two-Phase Alloys into the Truly Homogeneous State.- Nature of Microheterogeneity.- 10. Microhardness of Individual Phases and Structural Constituents of Metallic Alloys.- The Microhardness Method for Studying t
... weniger
Bibliographische Angaben
- Autor: V. M. Glazov
- 2012, Softcover reprint of the original 1st ed. 1971, 226 Seiten, Maße: 20,3 x 25,4 cm, Kartoniert (TB), Englisch
- Verlag: Springer, Berlin
- ISBN-10: 1468482483
- ISBN-13: 9781468482485
Sprache:
Englisch
Kommentar zu "Microhardness of Metals and Semiconductors"
0 Gebrauchte Artikel zu „Microhardness of Metals and Semiconductors“
| Zustand | Preis | Porto | Zahlung | Verkäufer | Rating |
|---|
Schreiben Sie einen Kommentar zu "Microhardness of Metals and Semiconductors".
Kommentar verfassen