Mono-Cycle Photonics and Optical Scanning Tunneling Microscopy
(Sprache: Englisch)
Deals with both the ultrashort laser-pulse technology in the few- to mono-cycle region and the laser-surface-controlled scanning-tunneling microscopy (STM) extending into the spatiotemporal extreme technology. The former covers the theory of nonlinear...
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Klappentext zu „Mono-Cycle Photonics and Optical Scanning Tunneling Microscopy “
Deals with both the ultrashort laser-pulse technology in the few- to mono-cycle region and the laser-surface-controlled scanning-tunneling microscopy (STM) extending into the spatiotemporal extreme technology. The former covers the theory of nonlinear pulse propagation beyond the slowly-varing-envelope approximation, the generation and active chirp compensation of ultrabroadband optical pulses, the amplitude and phase characterization of few- to mono-cycle pulses, and the feedback field control for the mono-cycle-like pulse generation. In addition, the wavelength-multiplex shaping of ultrabroadband pulses, and the carrier-phase measurement and control of few-cycle pulses are described. The latter covers the CW-laser-excitation STM, the femtosecond-time-resolved STM and atomic-level surface phenomena controlled by femtosecond pulses.
Inhaltsverzeichnis zu „Mono-Cycle Photonics and Optical Scanning Tunneling Microscopy “
- Nonlinear Propagation Theory and Few-Optical-Cycle Pulses beyond the Slowly-Varying-Envelope Approximation- Generation of Ultrabroadband Optical Pulses
- Active Chirp Compensation for Ultrabroadband Optical Pulses
- Amplitude and Phase Characterization of Few-Optical-Cycle Pulses
- Feedback Field Control for Optical Pulse Generation in the Monocycle Region
- Field Manipulation of Ultrabroadband Optical Pulses
- Fundamentals of Laser-Assisted Scanning Tunneling Microscopy
- Spatially Resolved Surface Photovoltage Measurement
- Atomic-Level Surface Phenomena Controlled by Femtosecond Optical Pulses
- Femtosecond-Time-Resolved Scanning Tunneling Microscopy
- Outlook.
Bibliographische Angaben
- 2005, 2005, 392 Seiten, Maße: 16,2 x 24,2 cm, Gebunden, Englisch
- Herausgegeben:Yamashita, Mikio; Shigekawa, Hidemi; Morita, Ryuji
- Herausgegeben: Mikio Yamashita, Hidemi Shigekawa, Ryuji Morita
- Verlag: Springer
- ISBN-10: 3540214461
- ISBN-13: 9783540214465
- Erscheinungsdatum: 13.01.2005
Sprache:
Englisch
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