Noise in Semiconductor Devices
Modeling and Simulation
(Sprache: Englisch)
Provides an overview of the physical basis of noise in semiconductor devices, and a detailed treatment of numerical noise simulation in small-signal conditions. It presents innovative developments in the noise simulation of semiconductor devices operating in large-signal quasi-periodic conditions.
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Produktinformationen zu „Noise in Semiconductor Devices “
Provides an overview of the physical basis of noise in semiconductor devices, and a detailed treatment of numerical noise simulation in small-signal conditions. It presents innovative developments in the noise simulation of semiconductor devices operating in large-signal quasi-periodic conditions.
Klappentext zu „Noise in Semiconductor Devices “
Provides an overview of the physical basis of noise in semiconductor devices, and a detailed treatment of numerical noise simulation in small-signal conditions. It presents innovative developments in the noise simulation of semiconductor devices operating in large-signal quasi-periodic conditions.
Inhaltsverzeichnis zu „Noise in Semiconductor Devices “
1. Noise in Semiconductor Devices.- 2. Noise Analysis Techniques.- 3. Physics-Based Small-Signal Noise Simulation.- 4. Results and Case Studies.- 5. Noise in Large-Signal Operation.- A. Appendix: Review of Probability Theory and Random Processes.- A.1 Fundamentals of Probability Theory.- A.2 Random Processes.- A.3 Correlation Spectra and Generalized Harmonic Analysis of Stochastic Processes.- A.4 Linear Transformations of Stochastic Processes.- A.5 Cyclostationary Stochastic Processes.- A.6 A Glimpse of Markov Stochastic Processes.- References.
Bibliographische Angaben
- Autoren: Fabrizio Bonani , Giovanni Ghione
- 2001, 2001, 213 Seiten, Maße: 16 x 24,1 cm, Gebunden, Englisch
- Verlag: Springer
- ISBN-10: 3540665838
- ISBN-13: 9783540665830
- Erscheinungsdatum: 31.07.2001
Sprache:
Englisch
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