Oscillation-Based Test in Mixed-Signal Circuits
(Sprache: Englisch)
This book presents the development and experimental validation of the structural test strategy called Oscillation-Based Test - OBT in short. The results presented here assert, not only from a theoretical point of view, but also based on a wide experimental...
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Klappentext zu „Oscillation-Based Test in Mixed-Signal Circuits “
This book presents the development and experimental validation of the structural test strategy called Oscillation-Based Test - OBT in short. The results presented here assert, not only from a theoretical point of view, but also based on a wide experimental support, that OBT is an efficient defect-oriented test solution, complementing the existing functional test techniques for mixed-signal circuits.
Inhaltsverzeichnis zu „Oscillation-Based Test in Mixed-Signal Circuits “
From the contents1. Oscillation-Based Test Methodology
2. Mathematical Review of Non-linear Oscillators
3. OBT Methodology for Discrete-Time Filters
4. OBT Methodology for Modulators
5. OBT Implementation in Discrete-Time Filters
6. Practical considerations for OBT-OBIST application
7. OBT/OBIST silicon validation
- Appendices. Conclusions. References
Autoren-Porträt von Jose Luis Huertas Díaz, Gloria Huertas Sánchez, Adoración Rueda Rueda, Diego Vázquez García de la Vega
Prof. José Luis Huertas is Director of the Instituto de Microelectronica de Sevilla in Spain. He has edited one book on Testing for Kluwer, that published in October 2004, and was series editor for the three book series from the European Mixed-Signal Initiative for Electronic System Design.
Bibliographische Angaben
- Autoren: Jose Luis Huertas Díaz , Gloria Huertas Sánchez , Adoración Rueda Rueda , Diego Vázquez García de la Vega
- 2006, 468 Seiten, Maße: 16 x 24,1 cm, Gebunden, Englisch
- Verlag: Springer Netherlands
- ISBN-10: 1402053142
- ISBN-13: 9781402053146
- Erscheinungsdatum: 06.11.2006
Sprache:
Englisch
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